Pratik Chaturvedi
University of Illinois at Urbana–Champaign
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Publication
Featured researches published by Pratik Chaturvedi.
Nano Letters | 2009
Logeeswaran Vj; Nobuhiko P. Kobayashi; M. Saif Islam; Wei Wu; Pratik Chaturvedi; Nicholas X. Fang; Shih Yuan Wang; R. Stanley Williams
We demonstrate an effective method for depositing smooth silver (Ag) films on SiO(2)/Si(100) substrates using a thin seed layer of evaporated germanium (Ge). The deposited Ag films exhibit smaller root-mean-square surface roughness, narrower peak-to-valley surface topological height distribution, smaller grain-size distribution, and smaller sheet resistance in comparison to those of Ag films directly deposited on SiO(2)/Si(100) substrates. Optically thin ( approximately 10-20 nm) Ag films deposited with approximately 1-2 nm Ge nucleation layers show more than an order of magnitude improvement in the surface roughness. The presence of the thin layer of Ge changes the growth kinetics (nucleation and evolution) of the electron-beam-evaporated Ag, leading to Ag films with smooth surface morphology and high electrical conductivity. The demonstrated Ag thin films are very promising for large-scale applications as molecular anchors, optical metamaterials, plasmonic devices, and several areas of nanophotonics.
ACS Nano | 2009
Pratik Chaturvedi; Keng Hsu; Anil Kumar; Kin Hung Fung; James C. Mabon; Nicholas X. Fang
Cathodoluminescence spectroscopy has been performed on silver nanoparticles in a scanning electron microscopy setup. Peaks appearing in the visible range for particles fabricated on silicon substrate are shown to arrive from excitation of out-of-plane eigenmodes by the electron beam. Monochromatic emission maps have been shown to resolve spatial field variation of resonant plasmon mode on length scale smaller than 25 nm. Finite-difference time-domain numerical simulations are performed for both the cases of light excitation and electron excitation. The results of radiative emission under electron excitation show an excellent agreement with experiments. A complete vectorial description of induced field is given, which complements the information obtained from experiments.
Applied Physics Letters | 2010
Pratik Chaturvedi; Wei Wu; Logeeswaran Vj; Zhaoning Yu; M. Saif Islam; S.Y. Wang; R. Stanley Williams; Nicholas X. Fang
We demonstrate a smooth and low loss silver (Ag) optical superlens capable of resolving features at 1/12th of the illumination wavelength with high fidelity. This is made possible by utilizing state-of-the-art nanoimprint technology and intermediate wetting layer of germanium (Ge) for the growth of flat silver films with surface roughness at subnanometer scales. Our measurement of the resolved lines of 30 nm half-pitch shows a full-width at half-maximum better than 37 nm, in excellent agreement with theoretical predictions. The development of this unique optical superlens leads promise to parallel imaging and nanofabrication in a single snapshot.
MRS Proceedings | 2006
Pratik Chaturvedi; Nicholas X. Fang
It has been experimentally demonstrated that a single layer of silver functions as a “superlens” [Fang et al, Science 308, 534 (2005)], providing image resolution much better than the diffraction limit. Resolution as high as 60 nanometer (λ/6) half-pitch was achieved. In this paper, we explore the possibility of further refining the image resolution using a “multilayer superlens” design. With optimized design of silver-alumina multilayer superlens, our numerical simulations show a feasibility of resolving 15nm features, about 1/26th of the illumination wavelength. We present preliminary experimental results targeted towards achieving the molecular scale imaging resolution. The development of potential low-loss and high resolution superlens opens the door to exciting applications in nanoscale optical metrology and nanomanufacturing.
Archive | 2010
Jun Xu; Anil Kumar; Pratik Chaturvedi; Keng Hsu; Nicholas X. Fang
We describe in this chapter development of plasmonic optical antennas for light concentration and near-field enhancement. A set of bow tie nanoantennas are fabricated and characterized with optical and electron excitation methods. Optical spectroscopy of these subwavelength antennas displays pronounced extinction peaks at resonant wavelength, showing total extinction cross sections as much as 10 times of their physical dimensions. On the other hand, coherent excitation of the bow tie antennas allows tuning the peak wavelength of the scattered light by changing the periodicity. Under dark-field microscopy, we observed the scattered waves from arrays of different bow tie antennas in complete visible spectrum. The local resonant modes of the bow tie antennas are also probed by focused electrons. Such cathodoluminescence spectroscopy reveals the fine details of enhanced field on the optical nanoantennas at resolution down to 20 nm. Finally, we show examples of surface-enhanced Raman spectroscopy on the nanoantennas. Effective designs based on local enhancement and radiation engineering of the plasmonic optical antennas would promise revolutionary changes in highly compact and integrated photonics for photon energy conversion, adaptive sensing, and image processing.
international conference on nanotechnology | 2008
Anil Kumar; Keng Hsu; Pratik Chaturvedi; Hyungjin Ma; Jun Xu; Nicholas X. Fang
The pressing need for energy conversion devices with higher efficiency and the pursuit for nano-scale sensing have called for intense research in the use of plasmonic nanostructures. In this work, we discuss fabrication and characterization of bowtie antennas with gaps down to 10 nm for optical frequencies. With structures as simple as equilateral triangles, we observed an extinction cross section of ten times the geometrical cross section, which is twice the value previously reported. Finally, we measured the scattering profile of a series of bowtie antennas with increased size using confocal microscopy.
international conference on nanotechnology | 2008
Logeeswaran Vj; Aaron M. Katzenmeyer; M.S. Islam; N.P. Kobayashi; Wei Wu; Pratik Chaturvedi; Nicholas X. Fang; S.Y. Wang; R.S. Williams
We discuss the electrical resistivity and thermal stability of smooth thin silver (Ag) films characterized by significantly lower root mean square (RMS) surface roughness, peak-to-valley height distribution, and grain-size distribution. The smooth film was prepared by using a very thin (~1-2 nm) nucleation layer of evaporated germanium (Ge) prior to Ag evaporation. The sheet resistance of the rough silver (10 nm Ag) film is RAg-rough ~51 Omega/sq compared to the smooth silver (10 nm Ag/2 nm Ge) film with RAg.smooth ~22 Omega/sq. The smooth Ag is also shown to be thermally more stable for temperatures less than 120degC.
Mrs Bulletin | 2008
Pratik Chaturvedi; Keng Hsu; Shu Zhang; Nicholas X. Fang
quantum electronics and laser science conference | 2009
David Cho; Wei Wu; Ekaterina Ponizovskaya; Pratik Chaturvedi; A. M. Bratkovsky; Shih-Yuan Wang; Xiang Zhang; Feng Wang; Y. Ron Shen
Frontiers of Physics in China | 2010
Pratik Chaturvedi; Nicholas X. Fang