Qingzhi Wen

Fabrication of SPES/Nano-TiO2 Composite Ultrafiltration Membrane and Its Anti-fouling Mechanism *

Abstract Membrane fouling is one of the major obstacles for reaching a high flux over a prolonged period of ultrafiltration (UF) process. In this study, a sulfonated-polyethersulfone (SPES)/nano-TiO 2 composite UF membrane with good anti-fouling performance was fabricated by phase inversion and self-assembly methods. The TiO 2 nanoparticle self-assembly on the SPES membrane surface was confirmed by X-ray photoelectron spectroscopy (XPS) and FT-IR spectrometer. The morphology and hydrophilicity were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM) and contact angle goniometer, respectively. The anti-fouling mechanism of composite UF membrane was discussed through the analysis of the micro-structure and component of UF membrane surface. The results showed that the TiO 2 content and the micro-structure of the composite UF membrane surface had great influence on the separation and anti-fouling performance.

Dielectric Analysis of Dynamic Fouling Behavior on Surface of Polyethersulfone Composite Ultrafiltration Membrane

A dielectric analysis model for the fouling layer on the polyethersulfone composite ultrafiltration (UF) membrane and solution system, which consists of the solution, concentration polarization layer (CPL), and cake layer, was established by virtue of the interfacial polarization and the electrostatic field theory. The effect of some important parameters, such as the depth, conductivity of CPL, and cake layer, on the dielectric spectroscopy (or dielectric relaxation properties) of the UF system was discussed by the parameter sensitivity analysis and the dielectric measurement. The simulations indicate that the CPL can be created rapidly and the cake layer formation is the dynamic balance process of growth and erosion in the process of UF. The key factor affecting on the dielectric spectrum of UF system is the electrical properties of the CPL and the cake layer. In comparison to the results of dielectric measurement, the simulations indicate that the model proposed in this work is valid and reliable to some degree for describing and explaining the dielectric relaxation phenomenon in UF system. It is very important to further understand the fouling behavior of membrane surface and optimize the controlling techniques of membrane fouling in the process of UF.