R. Grants

Modification of LiF structure by irradiation with swift heavy ions under oblique incidence

The structural modifications of LiF irradiated with swift heavy ions under oblique angles have been investigated using AFM, SEM, chemical etching, nanoindentation and optical absorption spectroscopy. LiF crystals were irradiated under incidence angles of 30 and 70 degrees with 2.2 GeV Au (fluence 57?l011 ions-cm2) and 150 MeV Kr ions (fluence 1012?1014 ions?cm?2). Structural study on sample cross-sections shows that two damage regions ? (1) nanostructured zone and (2) dislocation ? rich zone, which are typical for irradiations at normal incidence, appear also in samples irradiated under oblique angles. However in the latter case a more complex structure is formed that leads to stronger ion-induced hardening.

Characterization of Crystalline Structure and Morphology of Ga2O3 Thin Film Grown by MOCVD Technique

Growth of gallium oxide thin film was realized with MOCVD on (0001) sapphire substrate. Structural and compositional properties of thin film were studied employing trimethylgallium and water as precursors, carrier gases were H2 and N2. Obtained film is polycrystalline and predominantly consisted of (201) oriented β-Ga2O3. Sample exhibited blue luminescence which is attributed to oxygen vacancies. H2 gas proved to have beneficial effect on film quality and overall growth process.