R. S. Katiyar

Emerging memories: resistive switching mechanisms and current status

The resistance switching behaviour of several materials has recently attracted considerable attention for its application in non-volatile memory (NVM) devices, popularly described as resistive random access memories (RRAMs). RRAM is a type of NVM that uses a material(s) that changes the resistance when a voltage is applied. Resistive switching phenomena have been observed in many oxides: (i) binary transition metal oxides (TMOs), e.g. TiO(2), Cr(2)O(3), FeO(x) and NiO; (ii) perovskite-type complex TMOs that are variously functional, paraelectric, ferroelectric, multiferroic and magnetic, e.g. (Ba,Sr)TiO(3), Pb(Zr(x) Ti(1-x))O(3), BiFeO(3) and Pr(x)Ca(1-x)MnO(3); (iii) large band gap high-k dielectrics, e.g. Al(2)O(3) and Gd(2)O(3); (iv) graphene oxides. In the non-oxide category, higher chalcogenides are front runners, e.g. In(2)Se(3) and In(2)Te(3). Hence, the number of materials showing this technologically interesting behaviour for information storage is enormous. Resistive switching in these materials can form the basis for the next generation of NVM, i.e. RRAM, when current semiconductor memory technology reaches its limit in terms of density. RRAMs may be the high-density and low-cost NVMs of the future. A review on this topic is of importance to focus concentration on the most promising materials to accelerate application into the semiconductor industry. This review is a small effort to realize the ambitious goal of RRAMs. Its basic focus is on resistive switching in various materials with particular emphasis on binary TMOs. It also addresses the current understanding of resistive switching behaviour. Moreover, a brief comparison between RRAMs and memristors is included. The review ends with the current status of RRAMs in terms of stability, scalability and switching speed, which are three important aspects of integration onto semiconductors.

Magnetic and electrical properties of single-phase multiferroic BiFeO3

We have reported the structural, thermal, microscopic, magnetization, polarization, and dielectric properties of BiFeO3 ceramics synthesized by a rapid liquid-phase sintering technique. Optimum conditions for the synthesis of single-phase BiFeO3 ceramics were obtained. Temperature-dependent magnetization and hysteresis loops indicate antiferromagnetic behavior in BiFeO3 at room temperature. Although saturated ferroelectric hysteresis loops were observed in single-phase BiFeO3 ceramic synthesized at 880 °C, the reduced polarization is found to be due to the high loss and low dielectric permittivity of the ceramic, which is caused by higher leakage current.

Micro-Raman scattering and dielectric investigations of phase transition behavior in the BaTiO3–BaZrO3 system

In this study, the phase transition behavior of the BaTiO3–BaZrO3 system was studied using micro-Raman scattering and dielectric measurement techniques. BaZrxTi1−xO3 ceramics were prepared for x=0.00, 0.05, 0.08, 0.15, 0.20, and 1.00 compositions using a solid-state reaction technique. A single-phase perovskite structure of the ceramics was identified by the x-ray diffraction technique. The basic phase transition temperatures in these compositions were studied in the temperature range of 70–575 K. The tetragonal to cubic transition temperature was found to decrease with increasing Zr content. The orthorhombic to tetragonal transition temperature that increases with an initial increase in Zr content merges with the tetragonal–cubic transition for x⩾0.15 compositions. Raman spectra of rhombohedral and orthorhombic phases could not be distinguished. Excellent agreement between the crystallographic transition temperatures obtained by both techniques suggested that Zr substituted octahedra were uniformly distr...

Impedance spectroscopy of multiferroic Pb Zr x Ti 1 − x O 3 ∕ Co Fe 2 O 4 layered thin films

The electrical properties of ferroelectric

Probing Nanoscale Ferroelectricity by Ultraviolet Raman Spectroscopy

\mathrm{Pb}(\mathrm{Zr},\mathrm{Ti}){\mathrm{O}}_{3}

Effect of Mn substitution on electrical and magnetic properties of Bi0.9La0.1FeO3

(PZT) and ferromagnetic

Structural and multiferroic properties of La-modified BiFeO3 ceramics

\mathrm{Co}{\mathrm{Fe}}_{2}{\mathrm{O}}_{4}

Raman spectroscopy of Mg-Ta order-disorder in BaMg1/3Ta2/3O3

(CFO) thin film multilayers (MLs) fabricated by pulsed laser deposition technique has been studied by impedance and modulus spectroscopy. The effect of various PZT/CFO configurations having three, five, and nine layers has been systematically investigated. The transmission electron microscopy images revealed that the ML structures were at least partially diffused near the interface. Diffraction patterns indicate clear PZT and CFO crystal structures in the interior and at the interface of the ML structure. Room temperature micro-Raman spectra indicate separate PZT and CFO phases in ML structure without any impurity phase. We studied frequency and temperature dependencies of impedance, electric modulus, and ac conductivity of ML thin films in the ranges of

Investigations on solution derived aluminium doped zinc oxide thin films

100\phantom{\rule{0.3em}{0ex}}\mathrm{Hz}\char21{}1\phantom{\rule{0.3em}{0ex}}\mathrm{MHz}

Surface energy engineering for tunable wettability through controlled synthesis of MoS2.

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