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Featured researches published by R.S. Sirohi.


Optics Communications | 1998

Achromatic phase shifting by a rotating polarizer

S. Suja Helen; M. P. Kothiyal; R.S. Sirohi

We describe here an achromatic phase shifting arrangement based on polarization components in which the phase shifting is obtained by rotating a polarizer. These can be used in a polarization interferometer to introduce variable phase shift that is independent of wavelength.


Optics and Laser Technology | 1988

Improved techniques of collimation testing

M.P. Kothiyal; R.S. Sirohi; K.J. Rosenbruch

Abstract Improved techniques of collimation testing based on Talbot imaging and shearing interferometry are presented. The proposed techniques carry their own reference pattern to indicate collimation of the light beam. Detailed analysis is also given.


Applied Optics | 1992

Direct determination of focal length by using Talbot interferometry

Kuppuswamy Venkatesan Sriram; M. P. Kothiyal; R.S. Sirohi

A new and simple technique for the determination of the focal length of positive lenses and concave spherical surfaces by Talbot interferometry is described. Results of measurements are presented. We show that high measurement accuracy can be achieved with this technique.


Optical Engineering | 1994

Separation of the influence of in-plane displacement in multiaperture speckle shear interferometry

Nandigana Krishna Mohan; Prafulla J. Masalkar; Vadakke Matham Murukeshan; R.S. Sirohi

An imaging system with its aperture fully open or with a multiaperture mask in front has been used for carrying out speckle shear interferometry. The shearing is achieved by installing shear elements in front of the imaging system. The multiaperture configuration has built-in in-plane displacement sensitivity, and hence shear fringes obtained from multiaperture shear interferometer always carry the in-plane displacement contribution. This problem does not arise when the full aperture of the lens is used. A three-aperture speckle shear interferometric technique is introduced here to separate the in-plane displacement and slope contributions from the shear interferogram. Detailed theoretical and experimental results are presented.


Optical Engineering | 1993

Self-referencing collimation testing techniques

K. V. Sriram; M. P. Kothiyal; R.S. Sirohi

Self-referencing collimation testing techniques are briefly reviewed. New self-referencing configurations using Talbot and doublewedge plate shear interferometric techniques are described. Setting sensitivities of various arrangements are compared.


Applied Optics | 1992

Talbot interferometry in noncollimated illumination for curvature and focal length measurements

Kuppuswamy Venkatesan Sriram; M. P. Kothiyal; R.S. Sirohi

We describe a simple method for measuring the radius of curvature by using Talbot interferometry in a noncollimated light beam. This scheme can also be used to determine the focal length of the collimating lens employed in the setup. Results of the measurements are presented. A discussion of achievable accuracies and the proper choice of parameters is included.


Optics and Laser Technology | 1991

Setting sensitivity in Talbot interferometry with modified gratings

M. P. Kothiyal; Kuppuswamy Venkatesan Sriram; R.S. Sirohi

Abstract A dual field grating has been introduced for use in Talbot interferometry. We report here results of an experimental investigation on setting sensitivity when using these gratings for testing.


Journal of The Electrochemical Society | 1971

An Ellipsometric Study of Chromium Passivation

M. A. Genshaw; R.S. Sirohi

In situ ellipsometry has been combined with electrochemical measurements to gain insight into the mechanism of passivation of chromium in pH 1.7 solution. At −410 mV vs. NHE a region of active dissolution at an apparently oxide‐free surface was observed. With an anodic potential step to −360 mV, passivation occurs with growth of less than 1Aa of oxide film. This film is thicker at more anodic potentials and probably consists of .The mechanism of passivation most consistent with the experimental observations is that of simultaneous oxide formation and metal dissolution, with passivation resulting from formation of a monolayer of film.


Applied Optics | 1985

Speckle and speckle-shearing interferometers combined for the stimultaneous determination of out-of-plane displacement and slope

R. K. Mohanty; C. Joenathan; R.S. Sirohi

Speckle and speckle-shearing interferometer geometries have been combined into a single setup by the use of a small ground glass reference diffuser on the lens pupil. Sheared fields are obtained with a split lens arrangement. Judicious aperturing results in separated diffraction halos at the FT plane. Fringe patterns corresponding to out-of-plane displacement and slope are obtained by filtering via the appropriate halos. A four-aperture arrangement coupled with shearing elements extends the method to obtain the moire curvature pattern.


Applied Optics | 1993

Double-wedge-plate interferometer for collimation testing : new configurations

Kuppuswamy Venkatesan Sriram; P. Senthilkumaran; M. P. Kothiyal; R.S. Sirohi

Some new configurations of a wedge-plate interferometer are described that use two wedge plates for collimation testing with a built-in reference unlike a single wedge plate for which an external reference is required. Theory and measurement results are presented.

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M. P. Kothiyal

Indian Institute of Technology Madras

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C. Joenathan

Rose-Hulman Institute of Technology

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N. Krishna Mohan

Indian Institute of Technology Madras

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Kuppuswamy Venkatesan Sriram

Indian Institute of Technology Madras

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P. Senthilkumaran

Indian Institute of Technology Delhi

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R.K. Mohanty

Indian Institute of Technology Madras

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J.S. Darlin

Indian Institute of Technology Madras

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S. Suja Helen

Indian Institute of Technology Madras

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Shanti Bhattacharya

Indian Institute of Technology Madras

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D.K. Sharma

Indian Institute of Technology Madras

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