Raimund Oberschmid

Identification of aging mechanisms in the optical and electrical characteristics of light-emitting diodes

We report new methods of identifying the effects of aging on the light–current (L–I) and current–voltage (I–V) characteristics of AlInGaP light-emitting diodes (LEDs). We believe that these methods are also applicable to other III–V compound semiconductors. We observe a broadening of the nonlinear range of the L–I characteristic accompanied by a shift to higher currents in the I–V characteristic. These features can be attributed to an increase of nonradiative recombination processes in the active layer. A second process, however, can lead to an increase of the LED output power. We conclude from an analysis of the current dependence that this process is due to a different mechanism.

Internal quantum efficiency of high-brightness AlGaInP light-emitting devices

The internal quantum efficiency of (AlxGa1−x)0.5In0.5P light-emitting devices (LEDs), with an emission wavelength ranging from 650 to 560 nm, is determined by means of a model that takes into account the radiative and nonradiative recombination in the active layer, the diffusive leakage of carriers into the confining layers, and the influence of photon recycling on the light extraction efficiency. The evaluation is based on measurements of the external quantum efficiency of the LEDs as a function of the operating current and temperature. The analysis provides the wavelength dependence of both the nonradiative recombination as well as the carrier leakage.

Color-dependent degradation of high-brightness AlGaInP LEDs

Operation-induced degradation of internal quantum efficiency of high-brightness (AlxGa1-x)0.5In0.5P light-emitting devices (LEDs) is analysed experimentally and theoretically. A test series of LEDs was grown by MOCVD with identical layer sequence but different Aluminum content x in the active AlGaInP layer resulting in devices emitting light between 644 nm and 560 nm. The analysis yields the wavelength dependence of both the nonradiative recombination constant A as well as the carrier leakage parameter C of devices before and after aging. While test devices with λ>615 nm are very stable, LEDs with shorter emission wavelengths exhibit both an increase of A and a slight decrease of C upon aging. Possible degradation mechanisms are discussed.