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Featured researches published by Rainer Brodmann.


Proceedings of SPIE, the International Society for Optical Engineering | 2009

Extraction of shape and roughness using scattering light

Jörg Seewig; G. Beichert; Rainer Brodmann; H. Bodschwinna; M. Wendel

The extraction of 3D shape and roughness by optical measurement techniques become more and more import in industrial applications. Optical systems are measuring fast with high accuracy and give reliable information about the workpiece form or surface roughness. The classical systems based on triangulation, white light, confocal, shadow or fringe projection techniques and are applied with a great success in recent years. In future there will be a growing interest in robust inline measurement techniques to monitor the manufacturing process. E. g. some automotive manufactures are using confocal systems to characterize the surface of cylinder liners inline. But there is another robust and powerful technique suitable for inline measurement purposes: scattered light sensors. In this paper, a special type of a scattered light sensor based on the former Rodenstock RM 400 sensor is considered. The sensor enables the user to measure form and roughness in a robust manner. The properties of the sensor are analyzed system-theoretically.


Optical Methods for Areal Surface Texture Measurement | 2011

Light Scattering Methods

Theodore V. Vorburger; Richard M. Silver; Rainer Brodmann; Boris Brodmann; Jörg Seewig

Light scattering belongs to a class of techniques known as area-integrating methods for measuring surface texture. Rather than relying on coordinate measurements of surface points, light scattering methods probe an area of the surface and yield parameters that are characteristic of the texture of the area as a whole. The specular beam intensity, the angle-resolved scatter and the angle-integrated scatter are examples of measurands from light scattering that can yield useful parameters of the surface texture. Uses of light scatter for inspecting the surfaces of mechanical and optical components as well as surfaces produced in semiconductor manufacturing are primarily reviewed here. Several documentary standards describing best practice are also briefly reviewed.


Archive | 2012

Device for detecting scattered light with a rotating prism

Rainer Brodmann; Boris Brodmann


Archive | 2016

Einrichtung zum berührungslosen Messen an Getriebewellen, insbesondere an Schneckenwellen und Arbeitsverfahren hierzu

Boris Brodmann; Rainer Brodmann


Archive | 2016

Verfahren zur berührungslosen Oberflächenmessung mit Messkorrektur

Rainer Brodmann; Boris Brodmann


Archive | 2017

Verfahren und einrichtung zur berührungslosen beurteilung der oberflächenbeschaffenheit eines wafers

Rainer Brodmann; Boris Brodmann


Archive | 2017

DEVICE FOR CONTACTLESS MEASUREMENT ON GEAR SHAFTS, IN PARTICULAR ON WORM SHAFTS AND WORKING METHOD FOR THE SAME

Rainer Brodmann; Boris Brodmann


Archive | 2016

METHOD AND DEVICE FOR EVALUATING SURFACE CHARACTERISTICS BASED ON THE ANGLE-RESOLVED STRAY LIGHT MEASURING METHOD WITH AUTOMATIC DETERMINATION OF THE POSITION OF THE WORKPIECE

Rainer Brodmann; Boris Brodmann


Archive | 2016

Verfahren und Einrichtung zur Beurteilung der Oberflächenbeschaffenheit nach der winkelaufgelösten Streulichtmessmethode mit automatischer Lageerkennung des Werkstücks

Rainer Brodmann; Boris Brodmann


Archive | 2016

METHOD FOR CONTACTLESS EVALUATION OF THE SURFACE PROPERTIES OF A BALL RACEWAY OF A BALL SCREW DRIVE

Rainer Brodmann; Boris Brodmann

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Jörg Seewig

Kaiserslautern University of Technology

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Richard M. Silver

National Institute of Standards and Technology

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Theodore V. Vorburger

National Institute of Standards and Technology

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