Ralf Nüske

Transforming graphite to nanoscale diamonds by a femtosecond laser pulse

Formation of cubic diamond from graphite following irradiation by a single, intense, ultra-short laser pulse has been observed. Highly oriented pyrolytic graphite (HOPG) samples were irradiated by a 100 fs pulse with a center wavelength of 800 nm. Following laser exposure, the HOPG samples were studied using Raman spectroscopy of the sample surface. In the laser-irradiated areas, nanoscale cubic diamond crystals have been formed. The exposed areas were also studied using grazing incidence x-ray powder diffraction showing a restacking of planes from hexagonal graphite to rhombohedral graphite

Time-Resolved X-ray Diffraction Investigation of the Modified Phonon Dispersion in InSb Nanowires.

The modified phonon dispersion is of importance for understanding the origin of the reduced heat conductivity in nanowires. We have measured the phonon dispersion for 50 nm diameter InSb (111) nanowires using time-resolved X-ray diffraction. By comparing the sound speed of the bulk (3880 m/s) and that of a classical thin rod (3600 m/s) to our measurement (2880 m/s), we conclude that the origin of the reduced sound speed and thereby to the reduced heat conductivity is that the C44 elastic constant is reduced by 35% compared to the bulk material.

Subpicosecond hard x-ray streak camera using single-photon counting.

We have developed and characterized a hard x-ray accumulating streak camera that achieves subpicosecond time resolution by using single-photon counting. A high repetition rate of 2 kHz was achieved by use of a readout camera with built-in image processing capabilities. The effects of sweep jitter were removed by using a UV timing reference. The use of single-photon counting allows the camera to reach a high quantum efficiency by not limiting the divergence of the photoelectrons.

Picosecond time-resolved x-ray refectivity of a laser-heated amorphous carbon film

We demonstrate thin film x-ray reflectivity measurements with picosecond time resolution. Amorphous carbon films with a thickness of 46 nm were excited with laser pulses characterized by 100 fs duration, a wavelength of 800 nm, and a fluence of 70 mJ/cm2. The laser-induced stress caused a rapid expansion of the thin film followed by a relaxation of the film thickness as heat diffused into the silicon substrate. We were able to measure changes in film thickness as small as 0.2 nm. The relaxation dynamics are consistent with a model which accounts for carrier-enhanced substrate heat diffusivity.

Time-resolved x-ray scattering from laser-molten indium antimonide.

We demonstrate a concept to study transient liquids with picosecond time-resolved x-ray scattering in a high-repetition-rate configuration. Femtosecond laser excitation of crystalline indium antimonide (InSb) induces ultrafast melting, which leads to a loss of the long-range order. The remaining local correlations of the liquid result in broad x-ray diffraction rings, which are measured as a function of delay time. After 2 ns the liquid structure factor shows close agreement with that of equilibrated liquid InSb. The measured decay of the liquid scattering intensity corresponds to the resolidification rate of 1 m/s in InSb.

Measurements of light absorption efficiency in InSb nanowires

We report on measurements of the light absorption efficiency of InSb nanowires. The absorbed 70 fs light pulse generates carriers, which equilibrate with the lattice via electron-phonon coupling. The increase in lattice temperature is manifested as a strain that can be measured with X-ray diffraction. The diffracted X-ray signal from the excited sample was measured using a streak camera. The amount of absorbed light was deduced by comparing X-ray diffraction measurements with simulations. It was found that 3.0(6)% of the radiation incident on the sample was absorbed by the nanowires, which cover 2.5% of the sample.

Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam

We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials.

Time resolved X-ray studies in semiconductor nanostructures

Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.