Raymond E. Bonner

A new computer program for analysis of scalar electrocardiograms.

Abstract A computer program for interpreting the adult 12-lead electrocardiogram has been evaluated. Four thousand electrocardiograms were used in the design of the program which was based on the diagnostic logic used in clinical electrocardiographic interpretation. An evaluation of the program so designed was conducted on 1435 other records, 1008 of which were abnormal. Ninety-seven percent of all records were correctly classified by the computer as either normal or abnormal. Ninety-four percent of all contour abnormality statements made were correct and only 6% of contour abnormality statements were omitted. Ninety-three percent of the normal electrocardiograms were correctly analyzed with most errors consisting of minor ST- and T-wave changes. Of the abnormal tracings, 1.2% were called normal. Eighty-two percent of all 1435 records had a completely acceptable computer interpretation.

Computer diagnosis of electrocardiograms. IV. A computer program for contour analysis with clinical results of rhythm and contour interpretation

Abstract The logic for the contour analysis programs and the results of a comparison of computer and physician diagnosis for over two thousand cases are described. A detailed breakdown of the patient population and nature of the errors made by the program is given. The effectiveness of the program as a screening tool is also considered.

Computer diagnosis of electrocardiograms. II. A computer program for EKG measurements.

Abstract This paper describes the logic of the measurement program. This program determines from the waveform the identity and nature of the various electrocardiogram complexes (i.e., QRS, P, T, etc.). It compares all such complexes to determine whether they are similar or different from each other. It identifies their amplitude and time-duration characteristics.

The P300: a system for automatic patterned wafer inspection

This paper describes a machine vision technique and associated system (the P300) for automated inspection of integrated circuit chips on multi-level patterned wafers for pattern defects and particulates. This inspection has been variously referred to as “micro,” “first optical,” and just “defect inspection.” Despite the fact that this inspection is primarily performed manually today, the effectiveness of manual inspection is marginal-especially for products requiring the detection of sub-micron defects. In the future, on smaller groundrule products, manual inspection will clearly become inadequate. The system described here performs this inspection on periodic patterns such as those found in memory and CCD arrays. It has been shown effective for inspecting a broad range of production wafers. A description of the problem and a survey of previous work are presented. Following these, the P300 system and associated image analysis algorithms are described. The image analysis technique consists of a reference comparison combined with certain devices (gated operators and statistical sampling) designed to significantly reduce false alarms with minimal reduction in detection probability. The current version of the system has demonstrated the ability to reliably find 0.5 μm defects and can be extended to smaller defect sizes. The technique is especially significant because of its high detection probability achieved at an extremely low false alarm rate. High throughput and low cost have been achieved due to both the unique algorithm and a custom parallel processor, which executes the inspection algorithm at high (video frame rate) throughput.

A new computer program for comparative analysis of serial scalar electrocardiograms: description and performance of the 1976 IBM program.

Abstract An ECG analysis program capable of serial comparison has been written and its performance tested by the authors. The data base consisted of 772 comparisons from patients each having an average of 2.7 ECGs within a 2-month period. In 1939 contour statements, there were 3.3% statements omitted and 6.3% statements erroneously added. In 72 evolving infarctions there were 8.7% statements omitted and 12.5% erroneously inserted. There were 1249 P, Q, QRS, S-T, and T actual measurement changes of which 4.1% were missed. Twelve percent of the measurement change found by the program was not actually present. The program appears clinically acceptable for measurement and analysis of significant serial changes in the majority of ECGs and performs reasonably well in the more difficult task of defining evolution of myocardial infarction.

The influence of editing on the performance of a computer program for serial comparison of electrocardiograms

In this study, three tests of computer ECG analysis function were conducted: 1) interpretation of serial tracings using the single record analysis program, i.e. without serial comparisons; 2) interpretation of the same tracings using a computer-comparison program; and 3) interpretation of these tracings using not only a computer-comparison program but also an editing program which allows amending of each serial record and insertion of any corrections into the computer data base before the next comparison. There was an over-all reduction of 84% in the number of statement changes needed to produce a correct final report by using the combined comparison and editing program. When this combined program was used, 81% of all computer interpretations required no alteration, --a considerable saving of time in analyzing serial electrocardiographic tracings. Serial comparison was required in in 27--45% of all ECGs taken in four medical centers.

The P300: An Approach to Automated Inspection of Patterned Wafers

As IC groundrules shrink, manual optical inspection of multilevel patterned wafers becomes ineffective if not impossible, and efforts to develop automatic wafer inspection systems have expanded. This paper describes one successful approach, the P300 Automatic Wafer Inspection System[1], which uses a greylevel reference comparison of adjacent cells to locate defects on periodic pattern. The defects may be either pattern anomalies or particulates. Experiments demonstrate that the P300, scanning at a rate significantly faster than a human inspector, finds over ninety percent of half micron defects and over ninety-five percent of defects one micron or larger. By basing the inspection algorithm on a cell-to-cell comparison within a frame, as opposed to the conventional chip to chip or chip to CAD database reference, the system avoids detecting false alarms caused by acceptable variations in reflectivity, film thickness, critical dimensions and overlay registration over the surface of the wafer. A simple cell-to-cell comparison, however, would he prone to detecting false alarms due to electronic and digitization noise, aliasing, vibration, and illumination non-uniformity, as well as small scale acceptable process variation. By adding a statistical test to filter out noise and an edge detector to reduce sensitivity on edges, the false positive rate has been kept below a fraction of a percent of the frames inspected. The paper will discribe the system architecture and inspection algorithms and discuss specific inspection applications.