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Dive into the research topics where René Dändliker is active.

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Featured researches published by René Dändliker.


Optics Letters | 1988

Two-wavelength laser interferometry using superheterodyne detection

René Dändliker; R. Thalmann; D. Prongué

In two-wavelength interferometry, synthetic wavelengths are generated in order to reduce the sensitivity or to extend the range of unambiguity for interferometric measurements. Here a novel optoelectronic technique, called superheterodyne detection, is presented, which permits measurement of the phase difference of two optical frequencies that cannot be resolved by direct optoelectronic heterodyne detection. This technique offers the possibility for operation of two-wavelength interferometry in real time with arbitrary synthetic wavelengths from micrometers to meters in length. Preliminary experimental results are reported. An optical arrangement for absolute range-finding applications using tunable-laser sources (e.g., semiconductor lasers) is proposed.


Optics Letters | 1996

Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target

U. Schnell; René Dändliker; S. Gray

We have extended the use of a dispersive white-light interferometer for absolute distance measurement to include effects of dielectric multilayer systems on the target. The phase of the ref lected wave changes as a function of wavelength and layer thickness and causes errors in the interferometric distance measurement. With dispersive white-light interferometry these effects can be measured in situ, and the correct mechanical distance can be determined. The effects of thin films deposited upon the target have been investigated for one and two layers (photoresist and SiO(2) upon Si). Experimental results show that the thicknesses of these layers can also be determined with an accuracy of the order of 10 nm.


Applied Optics | 1994

Reciprocal reflection interferometer for a fiber-optic Faraday current sensor.

Guido Frosio; René Dändliker

A reciprocal fiber-optic reflection interferometer for remote measurement of electrical current through the Faraday effect is described. The effects of polarization cross coupling because of nonideal elements are eliminated with a low-coherence source. Nonreciprocal birefringence phase modulation is employed for detection of the Faraday phase shift. The theoretical predictions are confirmed by measurements with a piece of straight fiber as the sensing element in a 100-turn solenoid. Currents from 0 to 40 A have been measured with a linear response and a noise limit of ~0.015 A/√Hz.


Optics Letters | 2006

Frequency-comb-referenced two-wavelength source for absolute distance measurement

Nicolas Schuhler; Yves Salvadé; Samuel A. Leveque; René Dändliker; Ronald Holzwarth

We propose a new tunable laser source concept for multiple-wavelength interferometry, offering an unprecedented large choice of synthetic wavelengths with a relative uncertainty better than 10(-11) in vacuum. Two lasers are frequency stabilized over a wide range of frequency intervals defined by the frequency comb generated by a mode-locked fiber laser. In addition, we present experimental results demonstrating the generation of a 90 mum synthetic wavelength calibrated with an accuracy better than 0.2 parts in 10(6). With this synthetic wavelength we can resolve one optical wavelength, which opens the way to absolute distance measurement with nanometer accuracy.


Optical Engineering | 1985

Heterodyne And Quasi-Heterodyne Holographic Interferometry

René Dändliker; R. Thalmann

The use of heterodyne and quasi-heterodyne techniques in holographic interferometry allows a quantitative evaluation of the interference phase with high accuracy and offers the possibility of automated interferogram processing. In this paper, the fundamentals of these electronic methods are reviewed, the possibilities and limitations are discussed, and some applications in the field of displacement and strain measurement are presented. Heterodyne holographic interferometry is well suited for scientific applications in which very high accuracy (1/1000 of a fringe) is needed. Quasi-heterodyne holographic interferometry with video processing is adequate for industrial applica-tions in which high speed and medium accuracy (1/100 of a fringe) are required.


IEEE Journal of Selected Topics in Quantum Electronics | 2002

Applications of SOI-based optical MEMS

W. Noell; P.-A. Clerc; L. Dellmann; B. Guldimann; Hans Peter Herzig; O. Manzardo; C. Marxer; Kenneth J. Weible; René Dändliker; N.F. de Rooij

After microelectromechanical systems (MEMS) devices have been well established, components of higher complexity are now developed. Particularly, the combination with optical components has been very successful and have led to optical MEMS. The technology of choice for us is the silicon-on-insulator (SOI) technology, which has also been successfully used by other groups. The applications presented here give an overview over what is possible with this technology. In particular, we demonstrate four completely different devices: (a) a 2 /spl times/ 2 optical cross connector (OXC)with an insertion loss of about 0.4 dB at a switching time of 500 /spl mu/s and its extension to a 4 /spl times/ 4 OXC, (b) a variable optical attenuators (VOA), which has an attenuation range of more than 50 dB (c) a Fourier transform spectrometer (FTS) with a spectral resolution of 6 nm in the visible, and (d) an accelerometer with optical readout that achieves a linear dynamic range of 40 dB over /spl plusmn/6 g. Except for the FTS, all the applications utilized optical fibers, which are held and self-aligned within the MEMS component by U-grooves and small leaf springs. All devices show high reliability and a very low power consumption.


IEEE\/ASME Journal of Microelectromechanical Systems | 2001

Fabrication of multilayer systems combining microfluidic and microoptical elements for fluorescence detection

J.-C. Roulet; Reinhard Völkel; Hans Peter Herzig; E. Verpoorte; N.F. de Rooij; René Dändliker

This paper presents the fabrication of a microchemical chip for the detection of fluorescence species in microfluidics. The microfluidic network is wet-etched in a Borofloat 33 (Pyrex) glass wafer and sealed by means of a second wafer. Unlike other similar chemical systems, the detection system is realized with the help of microfabrication techniques and directly deposited on both sides of the microchemical chip. The detection system is composed of the combination of refractive microlens arrays and chromium aperture arrays. The microfluidic channels are 60 /spl mu/m wide and 25 /spl mu/m deep. The utilization of elliptical microlens arrays to reduce aberration effects and the integration of an intermediate (between the two bonded wafers) aluminum aperture array are also presented. The elliptical microlenses have a major axis of 400 /spl mu/m and a minor axis of 350 /spl mu/m. The circular microlens diameters range from 280 to 300 /spl mu/m. The apertures deposited on the outer chip surfaces are etched in a 3000-/spl Aring/-thick chromium layer, whereas the intermediate aperture layer is etched in a 1000-/spl Aring/-thick aluminum layer. The overall thickness of this microchemical system is less than 1.6 mm. The wet-etching process and new bonding procedures are discussed. Moreover, we present the successful detection of a 10-nM Cy5 solution with a signal-to-noise ratio (SNR) of 21 dB by means of this system.


Applied Optics | 1992

Optimized kinoform structures for highly efficient fan-out elements

D. Prongué; Hans Peter Herzig; René Dändliker; Michael T. Gale

We discuss the realization of highly efficient fan-out elements. Laser-beam writing lithography is available now for fabricating smooth surface relief microstructures. We develop several methods for optimizing microstructure profiles. Only a small number of parameters in the object plane are necessary for determining the kinoform. This simplifies the calculation of M x N arrays also for large M and N. Experimental results for a 9-beam fan-out element are presented.


Journal of the Acoustical Society of America | 1988

Heterodyne interferometer for submicroscopic vibration measurements in the inner ear

Jean-Francois Willemin; René Dändliker; Shyam M. Khanna

Conditions in the inner ear for interferometric measurements are quite different from those encountered in other mechanical systems: (i) The inner ear is not mechanically stable, due to blood pulsations and breathing artifacts; (ii) access to the inner ear is limited by anatomical constraints that make it difficult to visualize the structures of interest; (iii) vibration amplitudes to be measured in the inner ear are very low; (iv) the structures in the inner ear are nearly transparent; therefore, the reflectivity is low and attempts to change this reflectivity artificially usually alter the response characteristics; (v) cells are subject to light damage if the incident light intensity is too high, which limits the laser power that can be utilized in the interferometer. A heterodyne interferometer specially designed to measure vibrations in the living inner ear is described. Theoretical and experimental characteristics of this instrument are discussed in detail. In contrast to the homodyne system, the measurement accuracy of this interferometer is not affected by the low-frequency animal movements. This system does not require attachment of a reference mirror to the animal, thereby providing an unobstructed view of the structure to be measured. It has a high linearity and dynamic range. Its vibration sensitivity is high (2.8 X 10(-13) m for 1-Hz bandwidth) even under the condition of low light reflectivity (0.02%), with 0.5-mW incident laser power.


Optical Engineering | 1996

Microlens array imaging system for photolithography

Reinhard Völkel; Hans Peter Herzig; Philippe Nussbaum; René Dändliker; W.B. Hugle

Keywords: flat panel displays ; compound eye ; microlenses ; micro-optics ; multi-aperture imaging ; optical images ; photolithography ; photoresists Reference EPFL-ARTICLE-183166 Record created on 2013-01-17, modified on 2017-05-10

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Hans Peter Herzig

École Polytechnique Fédérale de Lausanne

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N.F. de Rooij

École Polytechnique Fédérale de Lausanne

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D. Prongué

University of Neuchâtel

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P. Ehbets

University of Neuchâtel

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Yves Salvadé

École Normale Supérieure

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O. Manzardo

University of Neuchâtel

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P. Blattner

University of Neuchâtel

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Antonello Nesci

École Polytechnique Fédérale de Lausanne

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