Richard L. Baer
Agilent Technologies
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Featured researches published by Richard L. Baer.
electronic imaging | 2003
Richard L. Baer
A new method for testing the resolution of digital cameras has been developed. The new method is an extension of the ISO 12233 Slanted-edge Spatial Frequency Response test. The new method computes the spatial frequency response along the edge of a circle. It is especially well adapted to inexpensive imaging systems with rotationally symmetric blur and lens distortion. In addition to presenting the new method, a set of practical improvements, which can be applied to both the slanted-edge and circular-edge methods, is described.
electronic imaging | 2006
Richard L. Baer
The Poisson and Normal probability distributions poorly match the dark current histogram of a typical image sensor. The histogram has only positive values, and is positively skewed (with a long tail). The Normal distribution is symmetric (and possesses negative values), while the Poisson distribution is discrete. Image sensor characterization and simulation would benefit from a different distribution function, which matches the experimental observations better. Dark current fixed pattern noise is caused by discrete randomly-distributed charge generation centers. If these centers shared a common charge-generation rate, and were distributed uniformly, the Poisson distribution would result. The fact that it does not indicates that the generation rates vary, a spatially non-uniform amplification is applied to the centers, or that the spatial distribution of centers is non-uniform. Monte Carlo simulations have been used to examine these hypotheses. The Log-Normal, Gamma and Inverse Gamma distributions have been evaluated as empirical models for characterization and simulation. These models can accurately match the histograms of specific image sensors. They can also be used to synthesize the dark current images required in the development of image processing algorithms. Simulation methods can be used to create synthetic images with more complicated distributions.
Archive | 2005
Richard L. Baer
Archive | 2003
Dietrich W. Vook; Izhak Baharav; Xuemei Zhang; Ramakrishna Kakarala; Richard L. Baer
Archive | 2004
Richard L. Baer; Xuemei Zhang; Dietrich W. Vook
Archive | 2006
Richard L. Baer
Archive | 2002
Richard L. Baer
Archive | 2007
Richard L. Baer
Archive | 2005
Xuemei Zhang; Richard L. Baer; Dietrich W. Vook
Archive | 2004
Dietrich W. Vook; Richard L. Baer; Xuemei Zhang; S. Rosner; Izhak Baharav