Rie Ueno
Canon Inc.
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Publication
Featured researches published by Rie Ueno.
Japanese Journal of Applied Physics | 1999
Hiroyuki Hashimoto; Satoru Nishiuma; Kazuhiro Takada; Kumi Nakamura; Rie Ueno; Tohru Den
Both the energy losses of π electron plasmon and valence electron plasmon in polycrystalline graphite have been measured by reflected electron energy loss spectroscopy (REELS). It was found that when crystallites are smaller than 10 nm, the π plasmon energy is lower than the value estimated from the valence plasmon energy which directly reflects the density. Moreover, there is a correlation between the π plasmon energy and the relative intensity of the π plasmon peak to the elastic peak. Thus, the decrease of the π plasmon energy was explained by a crystallite size effect such as a decrease in π electron density. This REELS technique was applied to estimate the chemical state in carbon films obtained by thermal chemical vapor deposition (CVD). The two-dimensional distribution of the graphitic carbon was successfully measured at a spatial resolution of less than 1 µm.
Archive | 2007
Soichiro Kawakami; Hidetoshi Tsuzuki; Toshiaki Aiba; Rie Ueno; Masatoshi Watanabe
Archive | 1992
Yoshikazu Banno; Ichiro Nomura; Hidetoshi Suzuki; Takashi Noma; Rie Ueno
Archive | 2012
Soichiro Kawakami; Norishige Kakegawa; Akio Kashiwazaki; Toshiaki Aiba; Rie Ueno; Mikio Shimada; Kaoru Ojima; Takashi Noma
Archive | 2008
Toshiaki Aeba; Norishige Kakegawa; Akio Kashiwazaki; Soichiro Kawakami; Kaoru Kojima; Takashi Noma; Mikio Shimada; Rie Ueno; 理恵 上野; 薫 小嶋; 幹夫 島田; 総一郎 川上; 法重 掛川; 昭夫 柏崎; 敬 野間; 利明 饗場
Archive | 2007
Toshiaki Aeba; Soichiro Kawakami; Eiju Tsuzuki; Rie Ueno; Taketoshi Watanabe; 理恵 上野; 総一郎 川上; 壮俊 渡邉; 英寿 都築; 利明 饗場
Archive | 2008
Soichiro Kawakami; Norishige Kakegawa; Akio Kashiwazaki; Toshiaki Aiba; Rie Ueno; Mikio Shimada; Kaoru Ojima; Takashi Noma
Archive | 1999
Taiko Motoi; Masato Yamanobe; Rie Ueno; Toshiaki Aiba; Kumi Nakamura; Masaaki Shibata
Archive | 2006
Taiko Motoi; Rie Ueno
Archive | 2006
Wataru Kubo; Tsuyoshi Nomoto; Tetsuya Yano; Rie Ueno