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Dive into the research topics where Rmm Mattheij is active.

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Featured researches published by Rmm Mattheij.


CASA-report | 2007

Automatic partitioning for multirate methods

A. Verhoeven; B. Tasic; Theo G. J. Beelen; E.J.W. ter Maten; Rmm Mattheij

The (nonlinear) transient analysis of electrical circuit models plays an important role in circuit design. Multirate time integration can be able to achieve the same accuracy for much lower costs. An essential assumption is the existence of a good partition of the circuit in a slow and fast part. This paper describes how this can be done automatically.


Electronic Journal of Boundary Elements | 2007

The condition number of the BEM-matrix arising from Laplace's equation

W. Dijkstra; Rmm Mattheij


CASA-report | 2006

Error analysis of BDF compound-fast multirate method for differential-algebraic equations

A. Verhoeven; T.G.J. Beelen; A. El Guennouni; E.J.W. ter Maten; Rmm Mattheij; B. Tasic


Cmes-computer Modeling in Engineering & Sciences | 2006

Local defect correction for the boundary element method

G. Kakuba; Rmm Mattheij; M.J.H. Anthonissen


Archive | 2012

An improvement to the corrective smoothed particle method with the application to steady-state heat conduction problems

Q. Y. Hou; As Arris Tijsseling; Rmm Mattheij


Journal of Polymer Science Part B | 2012

Wall shape optimization for a thermosyphon loop featuring corrugated pipes

Pi Rosen Esquivel; Thije Boonkkamp ten Jhm; Jam Jacques Dam; Rmm Mattheij


Journal of Biomechanics | 2011

Numerical wall-shape optimization for laminar flow in corrugated pipes

Pi Rosen Esquivel; Thije Boonkkamp ten Jhm; Jam Jacques Dam; Rmm Mattheij


Physical Review E | 2010

Autofocus and two-fold astigmatism correction in HAADF-STEM

Maria E. Rudnaya; Broek van den W; Rmp Doornbos; Rmm Mattheij; J.M.L. Maubach


Journal of Fluids Engineering-transactions of The Asme | 2010

The Fourier modal method for aperiodic structures

Maxim Pisarenco; J.M.L. Maubach; I.D. Setija; Rmm Mattheij


Engineering Fracture Mechanics | 2010

Derivative-based image quality measure for autofocus in electron microscopy

Maria E. Rudnaya; Rmm Mattheij; J.M.L. Maubach

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J.M.L. Maubach

Eindhoven University of Technology

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Maria E. Rudnaya

Eindhoven University of Technology

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A. Verhoeven

Eindhoven University of Technology

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As Arris Tijsseling

Eindhoven University of Technology

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Thije Boonkkamp ten Jhm

Eindhoven University of Technology

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W. Dijkstra

Eindhoven University of Technology

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G. Kakuba

Eindhoven University of Technology

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Hjh Herman Clercx

Eindhoven University of Technology

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