Roberto Modica
STMicroelectronics
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Publication
Featured researches published by Roberto Modica.
Sensors | 2018
S. Tudisco; Francesco La Via; C. Agodi; Carmen Altana; Giacomo Borghi; M. Boscardin; Giancarlo Bussolino; L. Calcagno; Massimo Camarda; F. Cappuzzello; D. Carbone; Salvatore Cascino; G. Casini; M. Cavallaro; Caterina Ciampi; G.A.P. Cirrone; G. Cuttone; A. Fazzi; Dario Giove; G. Gorini; L. Labate; G. Lanzalone; Grazia Litrico; Giuseppe Longo; Domenico Lo Presti; Marco Mauceri; Roberto Modica; Maurizio Moschetti; A. Muoio; F. Musumeci
Silicon carbide (SiC) is a compound semiconductor, which is considered as a possible alternative to silicon for particles and photons detection. Its characteristics make it very promising for the next generation of nuclear and particle physics experiments at high beam luminosity. Silicon Carbide detectors for Intense Luminosity Investigations and Applications (SiCILIA) is a project starting as a collaboration between the Italian National Institute of Nuclear Physics (INFN) and IMM-CNR, aiming at the realization of innovative detection systems based on SiC. In this paper, we discuss the main features of silicon carbide as a material and its potential application in the field of particles and photons detectors, the project structure and the strategies used for the prototype realization, and the first results concerning prototype production and their performance.
Materials Science Forum | 2016
M. Mazzillo; A. Sciuto; Fabrizio Roccaforte; Corrado Bongiorno; Roberto Modica; Salvatore Marchese; Paolo Badala; Denise Calì; Francesco Patanè; B. Carbone; Alfio Russo; Salvatore Coffa
Ultraviolet (UV) monitoring is of great interest in the healthcare field to prevent excessive UV exposure risks. In the last years silicon carbide (SiC) has emerged as a suitable material for the fabrication of UV detectors. In this paper we propose a 4H-SiC Schottky photodiode with a continuous very thin Ni2Si layer operating at 0V, properly designed for UV radiation monitoring.
Microelectronics Reliability | 2007
S. Privitera; Roberto Modica; V. Cerantonio; G. Fallica; G. Pappalardo
The effects of thermal and intrinsic stress produced on SOI substrates by the field oxidation have been studied. Results of electrical and structural characterization obtained on SOI have been compared with standard bulk Si and a different structure has been adopted in order to reduce the induced stress.
Archive | 2003
Salvatore Leonardi; Roberto Modica
Microelectronic Engineering | 2010
S. Privitera; F. Wang; C. Niu; P. Dumont-Girard; H. Ding; K. Liu; Roberto Modica; C. Bongiorno
Archive | 2007
Piero Giorgio Fallica; Roberto Modica
Archive | 2003
Salvatore Leonardi; Roberto Modica; Giuseppe Arena
Archive | 2000
Salvatore Leonardi; Roberto Modica
Archive | 2015
Antonello Santangelo; Salvatore Cascino; Roberto Modica; Viviana Cerantonio; Maurizio Moschetti
Archive | 2006
Salvatore Leonardi; Roberto Modica