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Rochit Rajusman

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Publication

Featured researches published by Rochit Rajusman.

Archive | 2000

Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory

Glen Gomes; Anthony Le; James Alan Turnquist; Rochit Rajusman; Shigeru Sugamori

Archive | 2001

Event-based semiconductor test system for testing semiconductor components, has controller that regulates overall system activity and supplies test programs with event time control data to event memory

Anthony Le; James Alan Turnquist; Rochit Rajusman; Shigeru Sugamori

Archive | 2001

Semiconductor test system and storing method for fail data

Anthony Le; Rochit Rajusman; Shigeru Sugamori; James Alan Turnquist; リー アンソニー; アラン ターンキスト ジェイムス; ラジュマン ロチェット; 茂 菅森

Archive | 2001

Generating device for test pattern and strobe signal and inserting method for delay time into timing data

Glen Gomes; Anthony Le; Rochit Rajusman; Shigeru Sugamori; James Alan Turnquist; リー アンソニー; エイ ゴメス グレン; アラン ターンキスト ジェイムス; ラジュマン ロチェット; 茂 菅森

Archive | 2001

Test pattern and strobe signal generator used in semiconductor test system, has delay insertion unit that inserts delay to time control data of specified event and duplicating unit for time control and event data

Glen Gomes; Anthony Le; James Alan Turnquist; Rochit Rajusman; Shigeru Sugamori

Archive | 2001

Semiconductor testing system, has electronic pin stage for supplying test pattern to tested semiconductor and detecting corresponding signal response

Anthony Le; Rochit Rajusman; James Alan Turnquist; Shigeru Sugamori

Archive | 2001

Ereignisgestütztes Prüfsystem mit einer Einrichtung zur Erzeugung von Prüfabschluß-Mehrfachsignalen Event aided inspection system comprising means for generating multiple signals Inspection

Anthony Le; Rochit Rajusman; Shigeru Sugamori; James Alan Turnquist

Archive | 2001

Halbleiterprüfsystem Semiconductor test system

Anthony Le; Rochit Rajusman; Shigeru Sugamori; James Alan Turnquist

Archive | 2001

Semiconductor test system with a facility for error data storage in compressed form

Anthony Le; Rochit Rajusman; James Alan Turnquist; Shigeru Sugamori

Archive | 2001

Ereignisgestütztes Halbleiterprüfsystem mit modularer Architektur zur Speicherprüfung

Rochit Rajusman; Shigeru Sugamori; Hiroaki Yamoto

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Shigeru Sugamori

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Anthony Le

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James Alan Turnquist

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Glen Gomes

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Hiroaki Yamoto

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