Network


Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot


Dive into the research topics where Roumen Ratchev is active.

Publication


Featured researches published by Roumen Ratchev.


international spring seminar on electronics technology | 2013

Absorption and diffusion of water in printed circuit boards

Heiner Zecha; Christiane Früh; Roumen Ratchev; Erik Biehl; Thomas Zerna

When exposed to harsh and humid environments, electronic systems can show electrochemical corrosion. One of the possible defects is Conductive Anodic Filament (CAF). This defect needs the presence of humidity. Though the moisture uptake of printed circuit boards has been studied thoroughly, a complete understanding of the diffusion processes and paths in printed circuit boards has not yet been achieved. This work deals with the anisotropy of moisture diffusion in the laminate. According to this purpose samples have been produced and tested. The results show a different absorption behavior according to sample type and base material as well as to storage temperature and humidity. The diffusion constants can be extracted from the measured mass changes of the samples. Since the different sample designs allow diffusion only in specific directions, a determination of the anisotropy is feasible. Furthermore, information on the storage location of the moisture in printed circuit boards can be gained. Therefore, samples have been produced to investigate the absorption behavior of different components of printed circuit boards such as resin and glass weave.


international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2010

Vibration reliability of SMD Pb-free solder joints

Mario Borras; Roumen Ratchev; Olivier Lanier; Michael Guyenot; Daniel Coutellier

This study presents a method to predict lifetime of SMD lead free solder joints submitted to vibrations. An experimental method is presented to test chip resistors under vibrations. A specially designed testboard allows testing several specimens simultaneously. The time to failure is electrically detected. The experimental method is simulated using the Finite Element Method (FEM) in order to correlate the stress level calculated on solder joints with the experimentally observed time to failure. The obtained results show that the Printed Circuit Board (PCB) has critical zones where the components fail at first. It is noticed that the damage on solder joint is mainly caused by the warpage of the PCB. On the contrary, the damage caused by the high local acceleration levels on the testboard is insignificant compared with the stress level caused by the warpage of the board.


2012 4th Electronic System-Integration Technology Conference | 2012

Thermal shock fatigue enhancement of solder joints by using novel reinforcing fabrics

H. Zecha; Roumen Ratchev; T. Zerna

To meet the increasing lifetime requirements of solder joints in thermal cycling, the coefficient of thermal expansion (CTE) of the printed circuit board (PCB) has to be conformed to the CTE of the surface mounted devices (SMD). Novel reinforcing fabrics were successfully used to reduce the CTE of the PCB. Thereby, the mismatch in the CTE of PCB and SMD was reduced. In order to check the expected effect of the improvements, chip resistors were mounted to the PCBs. The samples were aged in a temperature shock test between −40 °C and 125 °C. The characterization of the ageing behavior was done by measuring the required force to shear SMDs off the PCB as well as analysis of crack lengths. The results with the improved CTE showed significant improvement in lifetime of the solder joints.


intersociety conference on thermal and thermomechanical phenomena in electronic systems | 2008

Thermal test- and field cycling induced degradation and its FE-based prediction for different SAC solders

Rainer Dudek; Wolfgang Faust; Roumen Ratchev; M. Roellig; Hans-J. Albrecht; Bernd Michel


international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2014

Description of the thermo-mechanical properties of a Sn-based solder alloy by a unified viscoplastic material model for Finite Element calculations

A. Kabakchiev; B. Métais; Roumen Ratchev; Michael Guyenot; P. Buhl; M. Hossfeld; X. Schuler; R. Metasch; Mike Roellig


international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2014

Experimental investigation of the visco-plastic mechanical properties of a Sn-based solder alloy for material modelling in Finite Element calculations of automotive electronics

R. Metasch; Mike Roellig; A. Kabakchiev; B. Métais; Roumen Ratchev; Karsten Meier; K.-J. Wolter


european microelectronics and packaging conference | 2013

Micro-structural changes and crack propagation in solder joints due to vibration

Bastian Reichling; Andreas Fix; Roumen Ratchev; Jürgen Wilde


Archive | 2013

STRESS-MINIMISING ELECTRICAL THROUGH-CONTACT

Michael Guyenot; Friedhelm Guenter; Roumen Ratchev; Reiner Ramsayer; Andreas Fix


electronic components and technology conference | 2018

New Failure Mechanism in High Temperature Resin Materials

Michael Guyenot; D. Maas; Roumen Ratchev; A. Khoshamouz; T. Gottwald; S. Kreuer


international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems | 2015

Experimental investigation on microstructural influence towards visco-plastic mechanical properties of Sn-based solder alloy for material modelling in finite element simulations

R. Metasch; R. Schwerz; Mike Roellig; A. Kabakchiev; B. Métais; Roumen Ratchev; K.-J. Wolter

Collaboration


Dive into the Roumen Ratchev's collaboration.

Researchain Logo
Decentralizing Knowledge