Ruben Khachatryan

Sectioning of multilayers to make a multilayer Laue lens

We report a process to fabricate multilayer Laue lenses (MLLs) by sectioning and thinning multilayer films. This method can produce a linear zone plate structure with a very large ratio of zone depth to width (e.g., >1000), orders of magnitude larger than can be attained with photolithography. Consequently, MLLs are advantageous for efficient nanofocusing of hard x rays. MLL structures prepared by the technique reported here have been tested at an x-ray energy of 19.5 keV, and a diffraction-limited performance was observed. The present article reports the fabrication techniques that were used to make the MLLs.

Achromatic nested Kirkpatrick–Baez mirror optics for hard X-ray nanofocusing

A nested Kirkpatrick–Baez mirror pair has been designed, fabricated and tested for achromatic nanofocusing synchrotron hard X-rays. The prototype system achieved a FWHM focal spot of about 150 nm in both horizontal and vertical directions.

Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections

Resonant inelastic X-ray scattering (RIXS) experiments require special sets of near-backscattering spherical diced analyzers and high-resolution monochromators for every distinct absorption-edge energy or emission line. For the purpose of aiding the design and planning of efficient RIXS experiments, a compilation of suitable crystal materials and viable reflections for hard X-rays, together with energy resolution and throughput information, is presented.

Using angular dispersion and anomalous transmission to shape ultramonochromatic x rays

Optical spectrometers, instruments that work with highly monochromatic light, are commonly rated by the spectral bandwidth, which defines the ability to resolve closely spaced spectral components. Another equally important feature is the spectral contrast, the ability to detect faint objects among these components. Here we demonstrate that a combined effect of angular dispersion (AD) and anomalous transmission (AT) of x rays in Bragg reflection from asymmetrically cut crystals can shape spectral distributions of x rays to profiles with high contrast and small bandwidths. The AD and AT x-ray optics is implemented as a five-reflection, three-crystal arrangement featuring a combination of the above-mentioned attributes so desirable for x-ray monochromators and analyzers: a spectral contrast of {approx_equal} 500, a bandwidth of {approx_equal} 0.46 meV, and a remarkably large angular acceptance of {approx_equal} 107 {mu}rad with 9.1 keV x rays. The new optics can become a foundation for the next-generation inelastic x-ray scattering spectrometers for studies of atomic dynamics.

Precision mechanical design of an ultrahigh-resolution inelastic x-ray scattering spectrometer system with CDFDW optics at the APS

There are many scientific applications, especially involving topics related to the equilibrium atomic-scale dynamics of condensed matter, that require both a narrower and a steeper resolution function and access to a broader dynamic range than are currently available. To meet these important scientific needs, a prototype of a novel ultrahigh-resolution inelastic x-ray scattering spectrometer system has been designed and constructed at undulator-based beamline 30-ID at the Advanced Photon Source, Argonne National Laboratory. This prototype is designed to meet challenging mechanical and optical specifications for performing so-called CDFDW angular-dispersive x-ray crystal optics, which include a central ultra-thin CFW crystal and a pair of dispersing elements. The abbreviation CDFDW stands for: C – collimating crystal, D – dispersing-element crystal (two D-crystals are used in each CDFDW), F – anomalous transmission filter, and W – wavelength-selector crystal [1]. The mechanical design of the ultrahigh-resolution inelastic x-ray scattering spectrometer, as well as the preliminary test results of its precision positioning performance are presented in this paper.

Open-faced Z-shaped channel-cut x-ray monochromator

Channel-cut monochromators can be easily incorporated in high-resolution image techniques. However, polishing on the inner diffracting surfaces is difficult because of blockage by the opposite face. To address this difficulty, an open-faced monolithic monochromator has been designed, produced and tested using x-rays at the Advanced Photon Source (APS). The open-faced channel cut has a “Z”-shape geometry with a hole in the mid section to allow passage of the diffracted beam. The open geometry allowed chemical mechanical polishing so that an optically smooth finish on both surfaces was achieved. The high-resolution x-ray imaging and topography measurements revealed that the new design introduces significantly less distortions in the phase-contrast images compared with conventional channel-cut monochromators produced using etching alone.

Hard x-ray monochromator with milli-electron volt bandwidth for high-resolution diffraction studies of diamond crystals

We report on design and performance of a high-resolution x-ray monochromator with a spectral bandwidth of ΔE(X) ≃ 1.5 meV, which operates at x-ray energies in the vicinity of the backscattering (Bragg) energy E(H) = 13.903 keV of the (008) reflection in diamond. The monochromator is utilized for high-energy-resolution diffraction characterization of diamond crystals as elements of advanced x-ray crystal optics for synchrotrons and x-ray free-electron lasers. The monochromator and the related controls are made portable such that they can be installed and operated at any appropriate synchrotron beamline equipped with a pre-monochromator.

Optomechanical design of ultrahigh-resolution monochromator and analyzer for inelastic x-ray scattering spectrometer at the advanced photon source

A prototype of a novel ultrahigh-resolution inelastic x-ray scattering spectrometer has been designed and tested at undulator-based beamline 30-ID, at the Advanced Photon Source (APS), Argonne National Laboratory. This state-of-the-art instrument is designed to meet challenging mechanical and optical specifications for producing ultrahigh-resolution inelastic x-ray scattering spectroscopy data for various scientific applications. The optomechanical design of the ultrahigh-resolution monochromator and analyzer for inelastic x-ray scattering spectrometer as well as the preliminary test results of its precision positioning performance are presented in this paper.

Beam coherence and x-ray windows

Beryllium windows are used on many X-ray synchrotron beamlines to separate and protect the ultra-high vacuum of the storage ring from the experimental environment. Currently, such a window is typically made of a thin, high-purity, beryllium foil, which may or may not have been polished. It is well known that these windows affect the transmitted beam quality. The impact ranges from non-perceptible to profound, depending on the experiment. The degradation of the X-ray beam is of increasing importance and concern, however, and in fact a number of beamlines now are run windowless or with a very small and thin silicon nitride window. There remain many instances where a large and robust window is desirable or necessary, and it is for this reason that developing windows that have little or no impact on the transmitted X-ray beam quality is important. This presentation reports on the progress in developing single-crystal beryllium X-ray windows. Due to its high purity and homogeneity, relative structural perfection, and high polishiblity single-crystal beryllium is an attractive window material candidate, particularly for beamlines conducting imaging or coherence-based experiments. Development of thin and uniform windows with less than 1 nm rms surface roughness and their preliminary characterization results are presented.

Achieving optimal flatness and surface roughness properties for novel x-ray optic structures formed by dicing saws

Crystal-based x-ray optics are widely used in the synchrotron radiation field. Such optics include monochromators, channel-cut crystals, spectral analyzers, and phase plates that are generally made with standard fabrication tools such as grinders, ultrasonic mills, blade saws, and wire saws. However, modern synchrotron radiation instruments require more complicated and high-precision crystal structures that cannot be fabricated by these conventional tools. Examples include narrow channels and crystal cavities that require smooth and strain-free sidewalls or inner surfaces. Since it is extremely difficult to polish such surfaces by conventional means, specialized cutting tools are required to make the as-cut surfaces as smooth as possible. A possible way to obtain such smooth surfaces is to use a dicing saw as a fabrication tool - a tool typically used in the microelectronics industry to cut or dice semiconductor and other materials. Here we present our studies on the use of dicing saws for cutting innovative, monolithic, x-ray optic devices comprised of tall, narrow-standing, thin crystal-plate arrays. We report cutting parameters that include the rotational speed of the cutting blade (a.k.a. spindle speed), cutting speed (a.k.a. feed rate), number of passes for each cut depth (if required), and diamond grit size for producing the flattest and most smooth side walls. Blade type and construction (sintered, Ni, and resin) also play critical roles in achieving optimum results. The best experimental data obtained produced an average surface roughness of 49 nm and a peak-to-valley flatness of 3625 nm. By achieving these results, we have been able to assist experimenters in the synchrotron radiation field in their efforts to create functional and novel optical devices.