S. Duman

Effect of temperature on the current (capacitance and conductance)–voltage characteristics of Ti/n-GaAs diode

In this study, Ti/n-GaAs Schottky barrier diode has been fabricated by DC magnetron sputtering. The current–voltage, capacitance–voltage, and conductance–voltage characteristics of Ti/n–GaAs diode have been investigated in the temperature range of 80–320 K. The ideality factor and barrier height values have been calculated from the forward current–voltage characteristics. The variation of the diode parameters with the sample temperature has been attributed to the presence of the lateral inhomogeneities of the barrier height. The temperature dependent capacitance–voltage characteristics have been measured to calculate the carrier concentration, diffusion potential, barrier height, and temperature coefficient of the barrier height (α = −0.65 meV K−1). The fact that the temperature coefficient of the barrier height changes from metal to metal has been ascribed to the chemical nature of the contact metal or metal electronegativity.

Indium selenide: an insight into electronic band structure and surface excitations

We have investigated the electronic response of single crystals of indium selenide by means of angle-resolved photoemission spectroscopy, electron energy loss spectroscopy and density functional theory. The loss spectrum of indium selenide shows the direct free exciton at ~1.3 eV and several other peaks, which do not exhibit dispersion with the momentum. The joint analysis of the experimental band structure and the density of states indicates that spectral features in the loss function are strictly related to single-particle transitions. These excitations cannot be considered as fully coherent plasmons and they are damped even in the optical limit, i.e. for small momenta. The comparison of the calculated symmetry-projected density of states with electron energy loss spectra enables the assignment of the spectral features to transitions between specific electronic states. Furthermore, the effects of ambient gases on the band structure and on the loss function have been probed.

The Advent of Indium Selenide: Synthesis, Electronic Properties, Ambient Stability and Applications

Among the various two-dimensional semiconductors, indium selenide has recently triggered the interest of scientific community, due to its band gap matching the visible region of the electromagnetic spectrum, with subsequent potential applications in optoelectronics and especially in photodetection. In this feature article, we discuss the main issues in the synthesis, the ambient stability and the application capabilities of this novel class of two-dimensional semiconductors, by evidencing open challenges and pitfalls. In particular, we evidence how the growth of single crystals with reduced amount of Se vacancies is crucial in the road map for the exploitation of indium selenide in technology through ambient-stable nanodevices with outstanding values of both mobility of charge carriers and ON/OFF ratio. The surface chemical reactivity of the InSe surface, as well as applications in the fields of broadband photodetection, flexible electronics and solar energy conversion are also discussed.

The Growth of P-type TlGaSe2(1−x) S2x Single Crystals

TlGaSe2(1−x) S2x single crystals were grown by the modified Bridgman-Stockbarger method in our crystal growth laboratory. AIIIBIII C2VI compounds are formed of elements from vertical groups of the periodic table (group III: Tl, Ga, In; group VI: Se, S, Te) and are classified into two types. The first type has a layer structure: TlGaSe2, TlGaS2 and TlInS2. The second type has a chained structure: TlInSe2, TlInTe2 and TlGaTe2. None of the grown crystals had cracks and voids on the surface. The freshly cleaved crystals had a mirror-like surface and there was no need for mechanical or chemical polishing treatments. By the hot probe technique, we have found that the crystals were of p-type. The ingots produced were single crystalline and the useful region of single crystal was 90% with steps of 10 K if changes were small, and with steps of 3 and 5 K if changes were large in the direct and indirect band gaps energies. The direct and indirect band gaps for TlGaSe2(1−x)S2x samples were calculated as a function of temperature.

Electrical properties of Al/p–Ge and Al/Methyl Green/p–Ge diodes

Methyl green (MG) film has been grown for the first time on p–Ge semiconductor using a simple and low-cost drop coating method. The current–voltage (I–V) characteristics of Al/p–Ge and Al/MG/p–Ge diodes have been investigated in the temperature range of 20–300 K. A potential barrier height as high as 0.82 eV has been achieved for Al/MG/p–Ge diode, which has high rectification rate, at room temperature. It is seen that the barrier height of the Al/MG/p–Ge diode at the room temperature is larger than that of Al/p–Ge diode and ideality factor value of 1.14 calculated for Al/MG/p–Ge diode is lower than Al/p–Ge diode. The temperature coefficient of barrier height of the Al/MG/p–Ge diode has been calculated as 2.6 meV/K. The evaluation of current–voltage characteristics shows that the barrier height of the diode increases with the increasing temperature.

Electrical characterization of In/p-GaSe:Cd/Au–Ge single crystal grown by Bridgman/Stockbarger method

The temperature dependence of current–voltage (I-V) characteristics of Au–Ge/p-GaSe:Cd Schottky diode (SD) has been investigated in the temperature range of 40–360 K with a temperature step of 10 K under dark conditions. The characteristic parameters of the SD such as barrier height, ideality factor and series resistance have been determined from the I-V measurements. It has been shown that the ideality factor increases while the barrier height decreases with decreasing temperature. The values of series resistance obtained from modified Norde’s function. Series resistance values increase with decreasing temperature.

Growth and structural characterizations of GaSe and GaSe:Cd single crystals

GaSe and GaSe:Cd single crystals used in this research were grown by using the Bridgman/Stockbarger method. All of the samples were freshly and gently cleaved with a razor blade from the grown ingots and no further polishing and cleaning treatments were required because of the natural mirror-like cleavage faces. The Samples were cleaved along the cleavage planes (001). The structure and lattice parameters of the undoped GaSe and GaSe:Cd semiconductors have been analyzed using a X-ray diffractometer (XRD), Scanning electron microscopy (SEM) and energy dispersive X-rays (EDX) techniques. It is found that GaSe and GaSe:Cd crystals have hexagonal structure, quite close 2θ peak values. XRD measurements indicate that there is an increase in peak intensities at specific annealing temperatures (500°C). Cd doping causes a significant decrease in the XRD peak intensity.

The effect of Sn doping Urbach Tail and optical absorbtion measurements of InSe crystal

InSe and n-InSe:Sn crystals grown by Bridgman-Stockbarger method. Absorption measurements have been carried out in InSe and InSe:Sn samples in the temperature range 10–320 K with a step of 10 K. Sn doping to InSe have increased the absorption intensity and caused both increasing in the Urbach energy, decreasing in the steepness parameters and shifting of the absorption edge towards the shorter wavelengths. The steepness parameters and Urbach energy values for InSe and InSe:Sn samples have also increased with increasing sample temperature in the range 10-320 K.