S. Jeffrey Rosner
Agilent Technologies
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Publication
Featured researches published by S. Jeffrey Rosner.
Light-Emitting Diodes: Research, Manufacturing, and Applications IV | 2000
Michael R. Krames; Gina L Christenson; Dave Collins; Lou W. Cook; M. G. Craford; Allison Lynn Edwards; R. M. Fletcher; Nathan F. Gardner; Werner Goetz; William R. Imler; Eric Johnson; R Scott Kern; Reena Khare; F.A. Kish; Chris Lowery; M. J. Ludowise; Richard Mann; M. Maranowski; S. A. Maranowski; Paul S. Martin; J. O'Shea; Serge L Rudaz; Dan A. Steigerwald; James W. Thompson; Jonathan J. Wierer; Jingxi Yu; David Basile; Ying-Lan Chang; Ghulam Hasnain; M. Heuschen
Currently, commercial LEDs based on AlGaInN emit light efficiently from the ultraviolet-blue to the green portion of the visible wavelength spectrum. Data are presented on AlGaInN LEDs grown by organometallic vapor phase epitaxy (OMVPE). Designs for high-power AlGaInN LEDs are presented along with their performance in terms of output power and efficiency. Finally, present and potential applications for high-power AlGaInN LEDs, including traffic signals and contour lighting, are discussed.
Vertical-Cavity Surface-Emitting Lasers VII | 2003
Suning Xie; Robert W. Herrick; Gregory N. De Brabander; Wilson H. Cupertino Widjaja; Uli Koelle; An-Nien Cheng; Laura M. Giovane; Frank Z.Y. Hu; Mark R. Keever; Tim Osentowski; Scott A. McHugo; Myrna S. Mayonte; Seongsin M. Kim; Danielle R. Chamberlin; S. Jeffrey Rosner; G. Girolami
High speed fiber optic transceiver modules using parallel optics require that oxide-confined vertical-cavity surface-emitting lasers (VCSELs) be moisture resistant in non-hermetic environments. Conventional storage 85/85 (85°C and 85% relative humidity) testing without a bias does not adequately characterize oxide VCSEL’s moisture resistance. Oxide VCSELs do not fail or degrade significantly under such conditions. With a bias, however, we have found that moisture can cause failure modes not seen in dry reliability testing. Without proper device design and fabrication, these failure modes lead to high failure rates in oxide VCSELs. In this paper, we first discuss the failure mechanisms we have identified, including dense dislocation network growth, semiconductor cracking and aperture surface degradation, all in high humidity and high temperature under operating conditions. We then report the results of environmental reliability tests on Agilent’s oxide VCSELs developed for the parallel optics modules. The results from a large number of wafers produced over an extended period of time have shown consistent, robust environmental reliability.
Archive | 2005
Izhak Baharav; Robert C. Taber; S. Jeffrey Rosner
Archive | 2002
S. Jeffrey Rosner; Nasreen Chopra; Ang Shih
Archive | 2006
S. Jeffrey Rosner; Charles D. Hoke; Ken A. Nishimura
Archive | 2002
S. Jeffrey Rosner; Russell Iimura
Archive | 2001
S. Jeffrey Rosner
Archive | 2002
S. Jeffrey Rosner
MRS Online Proceedings Library Archive | 2002
Danielle R. Chamberlin; Scott A. McHugo; Dariusz Burak; Deyon Burke; Tim Osentowski; S. Jeffrey Rosner
Archive | 2005
Izhak Baharav; S. Jeffrey Rosner; Robert C. Taber; イザック・バハラヴ; エス・ジェフリー・ロスナー; ロバート・シー・タバー