S.K. Dhungel
Sungkyunkwan University
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Featured researches published by S.K. Dhungel.
Semiconductor Science and Technology | 2005
U Gangopadhyay; S.K. Dhungel; Kyunghae Kim; U Manna; P.K. Basu; H J Kim; B Karunagaran; K S Lee; J S Yoo; Junsin Yi
Multi-crystalline silicon surface etching without grain-boundary delineation is a challenging task for the fabrication of high efficiency solar cells. The use of sodium hydroxide–sodium hypochlorite (NaOH–NaOCl) solution for texturing a multi-crystalline silicon wafer surface in a solar cell fabrication line is reported in this paper. The optimized etching solution of NaOH–NaOCl does not have any effect on multi-crystalline silicon grain boundaries and it also has excellent isotropic etch characteristics, which ultimately helps to achieve higher values of performance parameters, especially the open circuit voltage (Voc) and fill factor (FF), than those in the case of conventional silicon texturing. Easy control over the reaction of the NaOH–NaOCl solution is also one of the major advantages due to which sophistication in controlling the temperature of the etching bath is not required for the industrial batch process. The FTIR analysis of the silicon surface after etching with the current approach shows the formation of Si–Cl bonds, which improves the quality of the diffused junction due to chlorine gettering during diffusion. We are the first to report 14–14.5% efficiency of very large area (150 mm × 150 mm) multi-crystalline silicon solar cells using a NaOH–NaOCl texturing approach in an industrial production line with a yield greater than 95%.
Solid State Phenomena | 2005
B. Karunagaran; Young Kuk Kim; Kyung Hae Kim; S.K. Dhungel; Jinsu Yoo; D. Mangalaraj; J. Yi
Titanium dioxide films were deposited using DC magnetron sputtering technique onto silicon substrates at ambient temperature and at an oxygen partial pressure of 7×10 –5 mbar and sputtering pressure (Ar + O2) of 1×10–3 mbar. The composition of the films, analyzed by Auger Electron Spectroscopy (AES), revealed the stoichiometry with an O and Ti ratio of 2.08. The optical constants of the as-deposited TiO2 thin film were determined by Spectroscopic Ellipsometry in the photon energy range 1.2 to 5.5 eV at room temperature. The measured dielectric-function spectra reveal distinct structures at energies of the E1, E1+D1 and E2 critical points due to interband transitions. The Dielectric constant values were found to be substantially lower than those for the bulk TiO2. The dielectric related optical constants, such as the refractive index, extinction coefficient, absorption coefficient and normal incidence of reflectivity are presented and analyzed. The deposited films were calcinated at 673 and 773 K. The influence of post-deposition calcination on the Raman scattering of the films was studied. The existence of Raman active modes A1g, B1g and Eg corresponding to the Raman shifts are reported in this paper. The improvement of crystallinity of the TiO2 films as shown by the Raman scattering studies has also been reported.
Transactions on Electrical and Electronic Materials | 2004
U. Gangopadhyay; Krishnendu Chakrabarty; S.K. Dhungel; Kyung-Hae Kim; Junsin Yi; D. Majumdar; H. Saha
Layer transfer process has emerged as a promising tool in the field of thin silicon solar cell technology. This process can use mono-crystalline silicon as a surface for the epitaxial growth of a thin layer of silicon. It requires some sort of surface conditioning of the substrate due to which the surface become suitable for homo-epitaxy and lift off after solar cell fabrication. The successful reuse of substrate has been reported. The use of the conditioned surface without any kind of epitaxial layer growth is also the issue to be addressed. This review paper basically describes the five most cost effective methods on which works are in progress. Several types of possible problems envisaged by different research groups are also incorporated here with necessary discussion. Work in Korea has already started in this area in collaboration IC Design and Fabrication Centre, Jadavpur University, India and that also has been mentioned.
Transactions on Electrical and Electronic Materials | 2004
U. Gangopadhyay; Kyung-Hae Kim; S.K. Dhungel; D. Mangalaraj; J.H. Park; J. Yi
A new method for fabrication of transistor like structure of the bifacial solar cell using spin-on doping and electroless plating has been proposed and the basic characteristics of the bifacial cell have been investigated. It is found that 9% increase in short circuit current is achieved with bifacial connection than the unifacial connection. Some unwanted effect of the series resistance on collection efficiency under different mode of illumination has been pointed out. Loss mechanisms inherent in the transistor like bifacial structure have also been discussed.
Transactions on Electrical and Electronic Materials | 2003
U. Gangopadhyay; Kyung-Hae Kim; J.H. Park; S.K. Dhungel; D. Mangalaraj; J. Yi; H. Saha; D.W. Kim
Anti-reflection properties of post diffusion doped spin-on source (in-situ AR coating) have been investigated in some detail. A simple experiment for reflectivity study using oblique incidence of light and necessary modification of the theory of minimum reflectivity at oblique incidence has been established. The comparative study of the in-situ AR coating with available spin-on AR film on silicon Solar Cell Surface have been investigated.
Thin Solid Films | 2005
J.B. Yoo; Jeonghul Lee; Seokki Kim; Kyunghoon Yoon; I Jun Park; S.K. Dhungel; B. Karunagaran; D. Mangalaraj; Junsin Yi
Solar Energy Materials and Solar Cells | 2006
Jinsu Yoo; I.O. Parm; U. Gangopadhyay; Kyunghae Kim; S.K. Dhungel; D. Mangalaraj; Junsin Yi
Solar Energy Materials and Solar Cells | 2007
U. Gangopadhyay; S.K. Dhungel; P.K. Basu; S.K. Dutta; H. Saha; Junsin Yi
Solar Energy Materials and Solar Cells | 2008
Kyunghae Kim; S.K. Dhungel; Sungwook Jung; D. Mangalaraj; J. Yi
Solar Energy Materials and Solar Cells | 2009
Jaehyeong Lee; N. Lakshminarayan; S.K. Dhungel; Kyunghae Kim; Junsin Yi