S.N. Kane

Influence of current annealing, stress, torsion and dc magnetic field on Matteucci effect in amorphous wires

Influence of axial dc magnetic field and applied stress on induced Matteucci voltage in as-cast and current annealed amorphous wires has been studied. Induced Matteucci voltage shows large variations with applied axial dc magnetic field and stress, which is further influenced by current annealing with or without torsion, via anisotropy induced by current annealing. Linear variation of induced Matteucci voltage with applied axial dc field and stress is reported that can be useful especially for field and stress sensors.

Mössbauer study of plastic deformation in amorphousFe40Ni40B20 and Fe78Si9B11C2 alloys

Abstract Structural defects produced by plastic deformation (cold rolling) in amorphous Fe 40 Ni 40 B 20 and Fe 78 Si 9 B 11 C 2 have been studied through Mossbauer spectroscopy by monitoring changes in relative line intensities, which show marked variation after different roll reduction and subsequent isochronal annealing. Present studies clearly show that defects are created throughout the bulk of the specimen and not localized in shear bands only. Annealing behavior of defects shows that the defects completely anneal out in a narrow temperature range well below the crystallization temperature.