S Pandey

A Statistical Approach to Examine the Impact of Various Meteorological Parameters on Pan Evaporation

Evaporation from surface water bodies is influenced by a number of meteorological parameters. The rate of evaporation is primarily controlled by incoming solar radiation, air and water temperature and wind speed and relative humidity. In the present study, influence of weekly meteorological variables such as air temperature, relative humidity, bright sunshine hours, wind speed, wind velocity, rainfall on rate of evaporation has been examined using 35 years(1971-2005) of meteorological data. Statistical analysis was carried out employing linear regression models. The developed regression models were tested for goodness of fit, multicollinearity along with normality test and constant variance test. These regression models were subsequently validated using the observed and predicted parameter estimates with the meteorological data of the year 2005. Further these models were checked with time order sequence of residual plots to identify the trend of the scatter plot and then new standardized regression models were developed using standardized equations. The highest significant positive correlation was observed between pan evaporation and maximum air temperature. Mean air temperature and wind velocity have highly significant influence on pan evaporation whereas minimum air temperature, relative humidity and wind direction have no such significant influence.

Microstructural and transport characterization of Co2MnSi thin films

We report structural and transport characterization on laser ablated full-Heusler alloy thin films of Co2MnSi grown on single crystalline (001) oriented SrTiO3 substrate. High resolution microstructural analysis reveals ultrafine-grained microstructure, where the individual grains are single crystalline with well oriented morphologies. The presence of the superlattice as well as fundamental diffraction peaks confirms the L21 ordering of the crystal structure. The temperature dependence of resistivity shows peculiar behaviour by showing a very low value of residual resistivity small ∼ 0.15 μΩ-cm. For thinner films, the resistivity is characterized by a minimum followed by square-root temperature dependence due to interference of the interaction between conduction electrons and their elastic scattering by static inhomogeneities.We report structural and transport characterization on laser ablated full-Heusler alloy thin films of Co2MnSi grown on single crystalline (001) oriented SrTiO3 substrate. High resolution microstructural analysis reveals ultrafine-grained microstructure, where the individual grains are single crystalline with well oriented morphologies. The presence of the superlattice as well as fundamental diffraction peaks confirms the L21 ordering of the crystal structure. The temperature dependence of resistivity shows peculiar behaviour by showing a very low value of residual resistivity small ∼ 0.15 μΩ-cm. For thinner films, the resistivity is characterized by a minimum followed by square-root temperature dependence due to interference of the interaction between conduction electrons and their elastic scattering by static inhomogeneities.

Structure and optical properties of MoS2 films deposited by different methods on glass and silicon substrates

Dip coating and thermal evaporation in vacuum have used to prepare MoS2 thin film for application in energy conversion. The details of preparing the thin films are given. The films have been characterized by XRD and reflectance spectroscopy to evaluate their quality, the results suggest that that both techniques produce good quality films and dip coating being low cost will be economically advantageous for preparing large area films for energy harvesting.