S. Tsukimoto

In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al

Electron energy loss spectroscopy was used to observe the segregation of Al on a Si surface above the melting point of Al. A mixture of Al and Si particles was heated above the melting point of Al in a vacuum of 1 × 10−5 Pa. The Si surface, which initially had been covered with an amorphous oxide layer before heating, became clean and atomically facetted when the Al melted. It was shown that the Si surface was segregated with Al.

Direct Observation of the Atomic Structure in a Solid-Liquid Interface

An experimental high-resolution image of a solid-liquid interface of solid Si and liquid Al-Si alloy has been compared with theoretical images obtained by computer simulation. It has been concluded that the solid-liquid interface has a transition layer, the structure of which is compatible with the 1 x 1 Si-{111} surface.

In Situ Transmission Electron Microscope Observation of Melting of Aluminum Particles.

; The processes of melting and freezing of aluminum (Al) particles have been observed directly in a transmission electron microscope. The liquid phase nucleated preferentially at the surface of an Al particle, surrounding the crystalline solid at the onset of melting. The liquid phase then propagated inside the Al particle at the expense of the solid.

Dynamic chemical mapping near a Si/SiO2 interface at elevated temperatures using plasmon‐loss images

Plasmon‐loss imaging was applied to chemical mapping during an in‐situ heating experiment. The technique was applied to observation of vibration of a Si/SiO2 interface which took place during reduction of SiO2 at high temperature. The chemical maps of Si and SiO2 were recorded dynamically using a conventional TV‐VTR system at a time resolution of 1/30 s.