Sadao Yoshikawa

Multistate memory device with reference bit lines

Semiconductor memory device with improved read characteristics for data having multi values

Semiconductor memory device including serial/parallel conversion circuit

Sense amplifier with improved sensitivity

Static memory device including supplemental gate capacitance

RESET CIRCUIT OF HIGH VOLTAGE CIRCUIT

Memory device with dummy cell transistor

Semiconductor device and method for testing semiconductor device

Memory device with parallel interface

Semiconductor device and test method thereof