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Sang-Moon Chon

Samsung

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Publication

Featured researches published by Sang-Moon Chon.

Archive | 2001

Method of manufacturing semiconductor devices, etching composition for manufacturing semiconductor devices, and semiconductor devices made using the method

Gyu-hwan Kwag; Se-Jong Ko; Kyung-Seuk Hwang; Jun-ing Gil; Sang-o Park; Dae-Hoon Kim; Sang-Moon Chon; Ho-Kyoon Chung

Archive | 1998

Apparatus and method for contact failure inspection in semiconductor devices

Chung-sam Jun; Jeong-kon Kim; Sang-Moon Chon; Sang Bong Choi

Archive | 1996

Thinner composition for washing a photoresist in a process for preparing semiconductors

Sang-Moon Chon; Boo-sup Lee; Sung-Il Kim; Jun-ing Gil; Pil-kwon Jun; Me-Suk Jun

Archive | 1998

Methods of employing aqueous cleaning compositions in manufacturing microelectronic devices

Joon-Ing Kil; Pil-kwon Jun; Min-Sang Yun; Young-hwan Yun; Gyu-Hwan Kwack; Sang-Moon Chon

Archive | 2000

Composition for removal of resist and method for removal of resist using the same

Sang-Moon Chon; Shunjo Kichi; Dong-Jin Park; Je Ueng Park; 相文 全; 東鎭 朴; 済應 朴

Archive | 2000

Photoresist stripper composition and photoresist stripping method using the same

Sang-Moon Chon; June-ing Gil; Mi-sook Jeon; Pil Kwon Jun; Sang Sik Moon; Je Ueng Park; 相文 全; 相植 文; 済應 朴; 弼権 田

Archive | 1998

Chemische Reinigungs- und Ätzlösung für die Herstellung von Halbleitervorrichtungen und ein Verfahren zur Herstellung von Halbleitervorrichtungen mittels derselben

Joon-Ing Kil; Pil-kwon Jun; Min-Sang Yun; Young-hwan Yun; Gyu-Hwan Kwack; Sang-Moon Chon

Archive | 1998

Method and device for inspecting defective contact of semiconductor device

Sang-Moon Chon; Chung-sam Jun; Teikon Kin; Soho Sai; 忠森 全; 相文 全; 相奉 崔; 定坤 金

Archive | 1999

MANUFACTURE OF SEMICONDUCTOR ELEMENT AND THE SEMICONDUCTOR ELEMENT

昊均 ▲鄭▼; Sang-Moon Chon; June-Ing Gil; Dae-Hoon Kim; Keiseki Ko; Seisho Ko; Gyu-Hwan Kwack; Sang-o Park; Kokin Tei; 相文 全; 俊仍 吉; 相五 朴; 奎煥 郭; 大勲 金; 世鍾 高; 景碩 黄

Archive | 2004

Electron source, electron beam inspection device and inspection method for semiconductor substrate

Sang-Moon Chon; Chung-sam Jun; Young-Jee Yoon; 忠森 全; 相文 全; 英智 尹

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Chung-sam Jun

Samsung

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Pil-kwon Jun

Samsung

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Gyu-Hwan Kwack

Samsung

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Joon-Ing Kil

Samsung

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Min-Sang Yun

Samsung

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Young-hwan Yun

Samsung

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Jeong-kon Kim

Samsung

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Jun-ing Gil

Samsung

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Boo-sup Lee

Samsung

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Dae-Hoon Kim

Samsung

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