Satoru Takakusagi

X-ray photoemission electron microscopy (XPEEM) as a new promising tool for the real-time chemical imaging of active surfaces

We have developed a XPEEM (X-ray photoemission electron microscopy) for a new surface imaging. XPEEM is a PEEM using X-ray as an excitation source and installed with an energy filter to select an X-ray photoelectron peak specific to the target atoms. XPEEM can image the distribution of elements, chemical states and chemical species at the working surface in a mesoscopic scale.

Dynamic aspects and associated structures of TiO2(110) and CeO2(111) surfaces relevant to oxide catalyses

This article gives a topical review of the dynamic behavior of surface species on two representative metal oxide surfaces of TiO2 (110) and CeO2(111) investigated by scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM). In addition, two new aspects, the self-limiting growth of Pt nanoparticles from MeCpPtMe3 on TiO2(110) regulated by a competitive reaction with TiOx suboxides and the inhomogeneous reactivity of surface oxygen atoms on CeO2(111) against methanol, are also imaged by STM and NC-AFM, which are relevant to key issues to understand the surface chemical reactivity and catalysis.

Development of an X‐ray photoemission electron microscopy system with multi‐probes, and its application to surface imaging at static and dynamic states

We have developed a new X‐ray photoemission electron microscopy system combined with low energy electron microscopy, photoemission electron microscopy, mirror electron microscopy (MEM), secondary electron emission microscopy (SEEM) and Auger electron emission microscopy, which provides multi‐angle information on the distribution and change of element, chemical state, structure, etc. at solid surfaces under the working conditions such as high temperature and gas atmosphere. The performance of each microscopical method was examined and typical images are presented. The dynamic behaviour of fabricated surfaces has been imaged in real time by SEEM and MEM.