Saulius Nevas

Gonioreflectometer for measuring spectral diffuse reflectance

Gonioreflectometric determination of reflectance factors that involves hemispherical collection of reflected flux, which is an alternative to integrating sphere-based methods, is discussed. A detailed description of a gonioreflectometer built at the Helsinki University of Technology is presented. The instrument is used to establish an absolute scale of total diffuse reflectance factors throughout the spectral range 360-830 nm. The hemispherical reflectance factors are obtained through integration of the gonioreflectometric measurement results. The reflectance factors of white high-quality artifacts can be determined with a combined standard uncertainty of 0.20%. Results of test measurements were found to be in agreement with values traceable to other absolute scales based on integrating-sphere methods.

Spectral irradiance measurements of tungsten lamps with filter radiometers in the spectral range 290 nm to 900 nm

A method of measuring the absolute spectral irradiance of quartz-halogen-tungsten lamps is described, based on the known responsivity of a filter radiometer, the components of which are separately characterized. The characterization is described for the wide wavelength range essential for deriving the spectrum of a lamp, from 260 nm to 950 nm. Novel methods of interpolation and measurement are implemented for the spectral responsivity of the filter radiometer. The combined standard uncertainty of spectral irradiance measurements is less than 1.4 parts in 102 from 290 nm to 320 nm (ultraviolet B) and 4 parts in 103 from 440 nm to 900 nm (visible to near-infrared). As an example, the derived spectral irradiances of two lamps measured at the Helsinki University of Technology (HUT, Finland) are presented and compared with the measurement results of the National Institute of Standards and Technology (NIST, USA) and the Physikalisch-Technische Bundesanstalt (PTB, Germany). The comparisons indicate that the HUT spectral irradiance scale is between those of the NIST and the PTB in the wavelength range 290 nm to 900 nm. The long-term reproducibility of the spectral irradiance measurements is also presented. Over a period of two years, the reproducibility appears to be better than 1 part in 102.

Characterization of thin films based on reflectance and transmittance measurements at oblique angles of incidence

The optical parameters of a SiO2 thin-film coating determined from the spectral reflectance and transmittance measurements at various incidence angles, including the normal incidence and the Brewsters angle, are compared in this paper. The high-accuracy measurements were carried out through visible-near-infrared spectral regions by using our purpose-built instruments. The optical parameters obtained from the reflectance and the transmittance data are consistent over the angles of incidence and agree within 0.2%. The effect of important systematic factors in the oblique-incidence spectrophotometric measurements is also discussed.

Intrinsic Wavelength Standard Absorption Bands in Holmium Oxide Solution for UV/visible Molecular Absorption Spectrophotometry

The transmittance minima of 18 absorption bands of a solution of 40 g/L holmium oxide in 10% (volume fraction) perchloric acid are certified as intrinsic traceable wavelength standards, by means of a multicenter measurement on material from a single source coupled with comparisons of a variety of preparations of the material evaluated on a single instrument. Fit-for-purpose artifact standards for the experimental calibration or validation of wavelength scales of chemical spectrophotometers can be carefully produced by end users themselves or by commercial standards producers. The intrinsic (data) standard confers traceability to the SI unit of length in place of costly transfer artifacts and repetitive calibration procedures. Certified values are provided for instrumental spectral bandwidths of 0.1–3.0 nm in 0.1 nm intervals, and information values are provided to a spectral bandwidth of 10 nm at wider intervals. Expanded uncertainties are typically less than ±0.1 nm for certified band positions.

Determination of thin-film parameters from high accuracy measurements of spectral regular transmittance

The importance of reliable spectral transmittance measurements for reliable thin-film characterization is demonstrated. By using a model of the spectral transmittance of thin-film samples, the effect of various uncertainty components in transmittance measurements on the determined thin-film parameters is analysed. The experimental results for aluminium dioxide and tantalum pentoxide thin-film samples show good agreement with the model.

Effect of correlations in fitting spectral irradiance data

The uncertainty of a primary spectral irradiance scale based on filter radiometers (FRs) is studied by analysing the propagation of uncertainties and covariances through a spectral interpolation process, when a modified Plancks radiation law is fitted to the measurement data. The advantage of performing the uncertainty analysis in optimizing the selection of the FR wavelengths is demonstrated. We also estimate the effect that correlations in the FR signals have on the uncertainty of the fitted spectral irradiance values. In the case of correlated input data, the results of the uncertainty propagation are found to be within two practical limits: uncertainty values in the FR data and the values obtained by uncertainty propagation with uncorrelated FR signals.

Characterization of GaAsP trap detector for radiometric measurements in ultraviolet wavelength region

A trap detector was constructed of three Schottky-type 10×10mm2 GaAsP photodiodes. The spectral reflectance of the trap detector was calculated from the measured spectral reflectances of a single GaAsP photodiode in the wavelength range between 240 and 600nm, and compared to the measured spectral reflectance of the trap detector at three laser wavelengths. The absolute spectral responsivity of the trap detector was measured. The internal quantum efficiencies (IQE) of the trap detector and a single photodiode were calculated in the wavelength region between 250 and 400nm from the spectral reflectances and responsivities. The comparison revealed reduction of the apparent IQE of the trap detector as compared to the single photodiode at the level of 10%. The spatial uniformity of the responsivity of the trap detector was measured, and the corresponding uncertainty component at 325nm was calculated to be 4×10−4. The effect of moderate ultraviolet exposure at the level of 50mJ∕cm2 on the stability of the respon...

Intercomparison of characterization techniques of filter radiometers in the ultraviolet region

Narrow-band filter radiometers at 248?nm, 313?nm, 330?nm and 368?nm wavelengths were used to compare calibration facilities of spectral (irradiance) responsivity at HUT, NPL and BNM?INM. The results are partly in agreement within the stated uncertainties. Use of demanding artefacts in the intercomparison revealed that the wavelength scales of the participating institutes deviate more than expected. Such effects cannot be seen in typical intercomparisons of spectral responsivity or spectral transmittance, where spectrally neutral samples are used.

Precision spectrometer for measurement of specular reflectance

The HUT reference spectrometer was modified for measuring specular reflectance in the wavelength range of 300 to 850 nm. The instrument is based on a diffraction-grating monochromator, reflecting optics, sample control mechanics and detection systems with linear responsitivities. Relative standard uncertainties between 0.14% and 0.32% were estimated for the reflectance measurements. For spectral reflectance between 1.5% and 15%, the results of test measurements using samples with known reflectances confirm that for all geometries the relative deviations are less than 0.36%. A set of ultraviolet (UV)-interference filters was measured in the UVB wavelength range, and the results are used as a part of filter radiometer characterization.

Comparison of spectral irradiance scales between the NIST and the HUT

The results of a comparison of spectral irradiance scales between the National Institute of Standards and Technology (NIST, USA), and the Metrology Research Institute, Helsinki University of Technology (HUT, Finland), are presented. The comparison was carried out by measuring irradiances of two sets of 1 kW FEL-type lamps in the spectral range 290 nm to 900 nm. One set had calibration from the NIST 1992 source-based scale and the other from the HUT detector-based scale. The spectral irradiance values measured by the HUT are slightly higher than those given by the NIST: the differences are less than 1% in the visible/near-infrared wavelength region and up to 3.3% in the ultraviolet. The relative expanded uncertainty (k = 2) of the comparison varies between 3.1% to 1.0% from 290 nm to 900 nm, respectively.