Savvas Damaskinos
University of Waterloo
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Featured researches published by Savvas Damaskinos.
Solar Energy Materials and Solar Cells | 1996
A. C. Ribes; Savvas Damaskinos; H.F. Tiedje; Arthur E. Dixon; D.E. Brodie
Abstract This paper describes a confocal scanning beam MACROscope/Microscope which can image specimens up to 7 × 7 cm in size using reflected light, photoluminescence and optical beam induced current. The MACROscope provides a 10 μm spot size at various wavelengths and generates 512 × 512 pixel images in less than 5 s. When used in combination with a conventional confocal scanning laser microscope sub-micron spot sizes become possible providing resolutions as high as 0.25 μm laterally and 0.5 μm axially in reflected light. The main function of this imaging system is to spatially resolve any defects within solar cells and similar devices. Several reflected-light, photoluminescence and OBIC images of CdS CuInSe 2 and CdZnS CuInSe 2 thin film solar cells are presented.
Applied Physics Letters | 1995
A. C. Ribes; Savvas Damaskinos; Arthur E. Dixon; Gary E. Carver; C. Peng; Philippe M. Fauchet; Tsun-Kong Sham; I. Coulthard
This letter describes a confocal scanning beam macroscope/microscope that can image specimens up to 7 cm in diameter using both photoluminescence and reflected light. The macroscope generates digital images (512×512 pixels) with a maximum 5 μm lateral resolution and 200 μm axial resolution in under 5 s, and in combination with a conventional confocal scanning laser microscope can provide quality control at a macroscopic/microscopic level for porous silicon specimens, wafers, detectors, and similar devices. This combination of instruments can also be used as a method for evaluating preparation parameters involved in the manufacture of porous silicon. Various confocal and nonconfocal photoluminescence and reflected‐light images of porous silicon are shown using both a macroscope and a conventional confocal scanning laser microscope. A 3D profile of a porous silicon structure reconstructed from confocal slices is also shown.
Journal of Microscopy | 1995
Arthur E. Dixon; Savvas Damaskinos; A. C. Ribes; K. M. Beesley
A new confocal scanning beam system (MACROscope) that images very large‐area specimens is described. The MACROscope uses a telecentric, f‐theta laser scan lens as an objective lens to image specimens as large as 7·5 cm × 7·5 cm in 5 s. The lateral resolution of the MACROscope is 5 μm and the axial resolution is 200 μm. When combined with a confocal microscope, a new hybrid imaging system is produced that uses the advantages of small‐area, high‐speed, high‐resolution microscopy (0·2 μm lateral and 0·4 μm axial resolution) with the large‐area, high‐speed, good‐resolution imaging of the MACROscope. The advantages of the microscope/MACROscope are illustrated in applications which include reflected‐light confocal images of biological specimens, DNA sequencing gels, latent fingerprints and photoluminescence imaging of porous silicon.
IEEE Journal of Selected Topics in Quantum Electronics | 2005
Paul Constantinou; Trudey Nicklee; David W. Hedley; Savvas Damaskinos; Brian C. Wilson
Recent advances in imaging technology have contributed greatly to biological science. Confocal fluorescence microscopes can acquire two-dimensional and three-dimensional images of biological samples such as live or fixed cells and tissues. Specimens that are large (e.g., a 10 mm/spl times/10 mm tissue section) and overfill the field of view (FOV) of typical microscope objectives require the use of image tiling to cover the entire specimen. This can be time consuming and cause artifacts in the composite image. The MACROscope system (Biomedical Photometrics Inc., Waterloo, ON, Canada) is a confocal device with a 22 mm/spl times/70 mm FOV designed for imaging large tissue sections in a single frame. The prototype demonstrated here can obtain images in reflected, transmitted, fluorescence, phase contrast, and hyperspectral modes. The new spectral imaging mode is characterized with a series of test targets, and sampled spectra are compared to a commercial spectrometer. Fluorescence images of human SiHa tumor xenografts stained with CD31-Cy3, showing blood vessel location, and EF5-Cy5, showing areas of tissue hypoxia, were collected. Differential phase contrast images of the same section, as well as human epithelial cells, were recorded to assess the phase contrast mode. Additionally, fluorescence images of Cytokeratin-Cy3 stained squamous cell carcinoma tissue sections were captured. Finally, red, green, blue transmitted light images of human tongue were obtained. This new device avoids the need for image tiling and provides simultaneous imaging of multiple fluorescently labeled tissue-specific markers in large biological samples. This enables time- and cost-efficient imaging of (immuno)histopathological samples. This device may also serve in the imaging of high-throughput DNA and tissue arrays.
Journal of Forensic Sciences | 2000
Rd Roorda; A. C. Ribes; Savvas Damaskinos; Arthur E. Dixon; Er Menzel
A highly sensitive confocal scanning-beam system for time-resolved imaging of fingerprints is described. Time-resolved imaging is a relatively new forensic procedure for the detection and imaging of latent fingerprints on fluorescent substrates such as paper, cardboard, and fluorescent paint. Ordinary fluorescent imaging of latent fingerprints on these surfaces results in poor contrast. Instead, the specimens are treated with a phosphorescent dye that preferentially adheres to the fingerprint which allows time-resolved discrimination between the fingerprint phosphorescence and the background fluorescence. Time resolved images are obtained by synchronizing the digital sampling of the specimen luminescence with the on-off cycle of the chopped illumination beam. The merit of this technique is illustrated with high contrast images of fingerprints obtained from the fluorescent painted surface of a Coke can.
Applied Optics | 1992
M. R. Atkinson; Arthur E. Dixon; Savvas Damaskinos
The use of optical differential phase-contrast microscopy to obtain the surface profile of samples is outlined. The range of accurate feature height determination was calculated as a function of steepness of the side of the feature. Heights of thin features (height <0.1 microm) were accurately determined experimentally. Sample tilting and oblique stage scanning were required in order to determine the heights of thicker samples. Reconstructed profile heights were measured as a function of defocus.
Progress in Surface Science | 1995
A. C. Ribes; Savvas Damaskinos; Arthur E. Dixon; K.A. Ellis; S.P. Duttaguptat; Philippe M. Fauchet
Abstract High resolution, large area photoluminescence mapping with scanning stage microscopes has proven to be a useful, but slow, quality control technique for compound semiconductor wafers. This paper describes a confocal scanning beam MACROscope-Microscope which can image specimens up to 7.5×7.5 cm in size, in less than 10s, using reflected light, photoluminescence, and optical beam induced current. MACROscope mode provides 5 μm lateral resolution and 300 μm axial resolution. Microscope mode provides 0.25 μm lateral and 0.5 μm axial resolution, with a minimum field of view of 25×25 μm. This instrument can be used to evaluate preparation parameters involved in the manufacture of porous silicon as well as to provide quality control at a macroscopic and microscopic level for the fabrication of porous silicon specimens, wafers, detectors, and similar devices. A brief introduction to confocal microscopy and porous silicon is given. Several confocal and non-confocal photoluminescence and reflected-light images of a porous silicon wafer are shown at macroscopic and microscopic levels. A 3D profile of porous silicon structures reconstructed from confocal slices is also shown.
Proceedings of SPIE, the International Society for Optical Engineering | 1996
Arthur E. Dixon; Savvas Damaskinos; A. C. Ribes
A new confocal scanning beam laser microscope/macroscope is described that combines the rapid scan of a scanning beam laser microscope with the large specimen capability of a scanning stage microscope. This instrument combines an infinity-corrected confocal scanning laser microscope with a scanning laser macroscope that uses a telecentric f*(Theta) laser scan lens to produce a confocal imaging system with a resolution of 0.25 microns at a field of view of 25 microns and 5 microns at a field of view of 75,000 microns. The frame rate is 5 seconds per frame for a 512 by 512 pixel image, and 25 seconds for a 2048 by 2048 pixel image. Applications in fluorescence are discussed that focus on two important advantages of the instrument over a confocal scanning laser microscope: an extremely wide range of magnification, and the ability to image very large specimens. Examples are presented of fluorescence and reflected-light images of high quality printing, fluorescence images of latent fingerprints, packaging foam, and confocal autofluorescence images of a cricket.
Micron | 1995
Savvas Damaskinos; Arthur E. Dixon; K.A. Ellis; William L. Diehl-Jones
Abstract A new confocal scanning laser microscope/macroscope (cslm/M) has recently been developed. It combines in one instrument the high resolution capability of a confocal scanning beam microscope for imaging small specimens, with good resolution confocal imaging of macroscopic specimens. Some of its main features include: (a) 0.25 μm lateral resolution in the microscope mode and 5 μm lateral resolution in the macroscope mode; (b) a field of view that can vary from 25 μm × 25 μm to 75,000 μm × 75,000 μm; (c) capability for acquiring large data sets from 512 × 512 pixels to 2048 × 2048 pixels; (d) 0.5 μm depth resolution in the microscope mode and 200 μm depth resolution in the macroscope mode. In this work the cslm/M was used to image whole biological specimens (> 5 m diameter), including insects which are ideal specimens for the macroscope. Specimens require no preparation, unlike scanning electron microscope (SEM) specimens which require a conductive coating. The specimens described in this paper are too large to be imaged in their entirety by a scanning beam laser microscope, however they can be imaged by slower scanning stage microscopes. In the macroscope mode the cslm/M was used to acquire a large number (e.g. 20–40) of confocal image slices which were then used to reconstruct a three-dimensional image of the specimen. High resolution images were collected by the cslm/M by switching to the microscope mode where high numerical aperture (NA) objectives were used to image a small area of interest. Reflected-light and fluorescence images of plant and insect specimens are presented which demonstrate the morphological details obtained in various imaging modes. A process for three-dimensional visualization of the data is described and images are shown.
IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology | 1995
Arthur E. Dixon; Savvas Damaskinos; A. C. Ribes; Eileen Seto; Marie-Claude Beland; Tetsu Uesaka; Brian E. Dalrymple; S. P. Duttagupta; Philippe M. Fauchet
A new confocal scanning beam laser microscope/macroscope is described that combines the rapid scan of a scanning beam laser microscope with the large specimen capability of a scanning stage microscope. This instrument combines an infinity-corrected confocal scanning laser microscope with a scanning laser macroscope that uses a telecentric f*(theta) laser scan lens to produce a confocal imaging system with a resolution of 0.25 microns at a field of view of 50 microns to 5 microns at a field of view of 75,000 microns. The frame rate is 3 seconds per frame for a 512 X 512 pixel image, and 45 seconds for a 2048 X 2048 pixel image. Changes made in the instrument to increase the image capture from 512 X 512 pixels to 2048 X 2048 pixels are described. Applications discussed focus on three important advantages of the instrument over a confocal scanning laser microscope: an extremely wide range of magnification, the ability to record very large data sets, and the ability to image very large specimens. Examples are presented from imaging of fibers in paper, latent fingerprint detection, and reflected-light and photoluminescence imaging of porous silicon.