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Dive into the research topics where Shalini Venkatesh is active.

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Featured researches published by Shalini Venkatesh.


Journal of Lightwave Technology | 1993

Phase noise considerations in coherent optical FMCW reflectometry

Shalini Venkatesh; Wayne V. Sorin

An analysis of coherent optical FMCW is presented. It shows the limitations imposed on measurements of discrete reflections and of Rayleigh backscattering due to phase noise originating in the finite coherence length of the optical source. The dependence of the range for accurate measurements on particular parameters of the optical system is discussed in the general case and for three specific laser sources. >


Applied Optics | 1990

Incoherent frequency modulated cw optical reflectometry with centimeter resolution

Shalini Venkatesh; David W. Dolfi

An incoherent, frequency modulated continuous wave optical reflectomer is described which utilizes a broadband LiNbO(3) electrooptic modulator and slow photodiode for optical downconversion and detection, and a waveform recorder for digital spectrum analysis of the incoming signal. A two-point resolution of 6.8 cm in fiber is achieved. The dynamic range, defined as the location of the system noise floor relative to the maximum producible signal, is 50-dB optical.


optical fiber sensors conference | 1992

Coherent FMCW Reflectometry Using a Piezoelectrically Tuned Nd:YAG Ring Laser

Shalini Venkatesh; W.V. Sorin; D.K. Donald; B.L. Heffner

Coherent optical implementations of the FMCW technique [1] depend on the interferometric mixing of an optical signal probing the network under test with a reference signal obtained from the same source, whose carrier frequency is linearly, and phase-continuously, chirped [2]. Limitations on measurement range may be reduced by the choice of a laser source of long coherence length, as demonstrated in Ref. 3, but the temperature tuning employed in that particular case is relatively slow and inconvenient. A more serious problem is spatial resolution degradation due to residual nonlinearities in the frequency chirp, but this may be significantly reduced by incorporating a reference interferometer in the measurement system to track the nonlinearity and compensate for it [4]. This paper describes a coherent optical FMCW system that uses piezoelectric rather than thermal tuning of a source of long coherence length, in a fiberoptic network which includes a reference interferometer, triggering data capture by a system with a Fast Fourier Transform capability.


Archive | 1997

Roller assembly having pre-aligned for on-line thickness measurements

Wayne V. Sorin; Shalini Venkatesh; Brian L. Heffner


Archive | 1995

Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces

Shalini Venkatesh; Wayne V. Sorin; Brian L. Heffner


Archive | 1995

Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal

Wayne V. Sorin; Brian L. Heffner; Shalini Venkatesh


Archive | 1997

Method and apparatus for on-line determination of the thickness of a multilayer film using a partially reflecting roller and low coherence reflectometry

Shalini Venkatesh; Brian L. Heffner; Wayne V. Sorin


Archive | 1995

Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry

Shalini Venkatesh; Wayne V. Sorin


Archive | 1996

System for determining the thickness and index of refraction of a film

Shalini Venkatesh; Brian L. Heffner; Wayne V. Sorin


Archive | 1997

Verfahren und Apparat zur Bestimmung der Dicke eines Mehrschichtfilms unter Anwendung einer teilreflektierenden Walze und der Niedrigkohärenzreflektometrie Method and apparatus for determining the thickness of a multilayer film using a roll and the partially reflecting Niedrigkohärenzreflektometrie

Brian L. Heffner; Shalini Venkatesh; Wayne V. Sorin

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