Shangquan Zhang

Abnormal morphology of amorphous germanium films in contact with palladium

Abstract The fractal and dense branching morphologies of amorphous germanium films in contact with palladium have been investigated by TEM. The experimental results suggest that the production of fractal morphology in Pd/a-Ge bilayer films was easier than that in a-Ge/Pd bilayer films. An island-like fractal morphology can be formed at the step and crevice hole areas annealed at higher temperatures. It is difficult for co-evaporated Pd–Ge films to realize fractal morphology. The formation of fractal morphology can be explained by a RSN model. The SAED patterns suggest that the dense branching morphology cannot be completely demonstrated by the Pd, Ge, Pa 2 Ge, PdGe and Pd 25 Ge 9 , maybe it is a new phase.

Formation of a palladium carbide with a palladium-silicide-like structure in fullerene-C60/Pd multilayers

We present structural studies of C60/Pd multilayer films. A new phase of a layered structure with a sixfold (or threefold) axis, which is similar to the metastable phase in Pd–Si alloys, has been observed by means of transmission electron microscope and X-ray diffraction in the C60/Pd multilayer films after annealed at 470 K 60 min. This new phase, which is believed to be one metastable phase of Pd–C, is a hexagonal structure with the lattice constant a = 0.438 nm. The reciprocal lattice points become continuous spikes in the direction c∗ of the reciprocal lattice, which indicates the Pd–C phase consists of layers.