Shigeki Mizushima
National Institute of Advanced Industrial Science and Technology
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Publication
Featured researches published by Shigeki Mizushima.
Metrologia | 2011
Birk Andreas; Yasushi Azuma; Guido Bartl; P. Becker; Horst Bettin; Michael Borys; Ingo Busch; P Fuchs; Kenichi Fujii; Hiroyuki Fujimoto; Ernest G. Kessler; Michael Krumrey; Ulrich Kuetgens; Naoki Kuramoto; Giovanni Mana; Enrico Massa; Shigeki Mizushima; Arnold Nicolaus; A. Picard; Axel Pramann; Olaf Rienitz; Detlef Schiel; S. Valkiers; Atsushi Waseda; S Zakel
This paper concerns an international research project aimed at determining the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The counting procedure was based on the measurement of the molar volume and the volume of an atom in two 1 kg crystal spheres. The novelty was the use of isotope dilution mass spectrometry as a new and very accurate method for the determination of the molar mass of enriched silicon. Because of an unexpected metallic contamination of the sphere surfaces, the relative measurement uncertainty, 3 × 10−8 NA, is larger by a factor 1.5 than that targeted. The measured value of the Avogadro constant, NA = 6.022 140 82(18) × 1023 mol−1, is the most accurate input datum for the kilogram redefinition and differs by 16 × 10−8 NA from the CODATA 2006 adjusted value. This value is midway between the NIST and NPL watt-balance values.
Metrologia | 2015
Yasushi Azuma; Pauline Barat; Guido Bartl; Horst Bettin; Michael Borys; Ingo Busch; L Cibik; G D’Agostino; Kenichi Fujii; Hiroyuki Fujimoto; Akiharu Hioki; Michael Krumrey; Ulrich Kuetgens; Naoki Kuramoto; Giovanni Mana; Enrico Massa; R Meeß; Shigeki Mizushima; Tomohiro Narukawa; Arnold Nicolaus; Axel Pramann; Savelas A. Rabb; Olaf Rienitz; C Sasso; Michael Stock; Robert D. Vocke; Atsushi Waseda; S Wundrack; S Zakel
New results are reported from an ongoing international research effort to accurately determine the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The surfaces of two 28Si-enriched spheres were decontaminated and reworked in order to produce an outer surface without metal contamination and improved sphericity. New measurements were then made on these two reconditioned spheres using improved methods and apparatuses. When combined with other recently refined parameter measurements, the Avogadro constant derived from these new results has a value of
conference on precision electromagnetic measurements | 2004
Kenichi Fujii; Atsushi Waseda; Naoki Kuramoto; Shigeki Mizushima; P. Becker; Horst Bettin; R. Arnold Nicolaus; Ulrich Kuetgens; S. Valkiers; Philip Taylor; Paul De Bièvre; Giovanni Mana; Enrico Massa; Richard J. Matyi; Ernest G. Kessler; M. Hanke
N_A = 6.022 140 76(12) \times 10^{23}
Metrologia | 2002
L. Vitushkin; M. Becker; Zhiheng Jiang; Olivier Francis; T. M. van Dam; J. E. Faller; J-M Chartier; M. Amalvict; S. Bonvalot; Nicole Debeglia; Sergio Desogus; Michel Diament; François Dupont; R. Falk; G. Gabalda; C. G. L. Gagnon; T. Gattacceca; Alessandro Germak; Jacques Hinderer; Claudio Origlia; O. Jamet; J. Mäkinen; G. Jeffries; R. Käker; Alexander Kopaev; J. Liard; A. Lindau; Laurent Longuevergne; B. Luck; E. N. Maderal
mol
Metrologia | 2011
Alain Picard; Pauline Barat; Michael Borys; M Firlus; Shigeki Mizushima
^{-1}
IEEE Transactions on Instrumentation and Measurement | 2003
Kenichi Fujii; Atsushi Waseda; Naoki Kuramoto; Shigeki Mizushima; Mitsuru Tanaka; S. Valkiers; Philip Taylor; R. Kessel; Paul De Bièvre
. The X-ray crystal density method has thus achieved the target relative standard uncertainty of
Metrologia | 2009
Alain Picard; N Bignell; Michael Borys; Stephen Downes; Shigeki Mizushima
2.0 \times 10^{-8}
IEEE Transactions on Instrumentation and Measurement | 2007
Naoki Kuramoto; Kenichi Fujii; Yasushi Azuma; Shigeki Mizushima; Yasutake Toyoshima
necessary for the realization of the definition of the new kilogram.
Metrologia | 2015
Olivier Francis; Henri Baumann; Christian Ullrich; Stefaan Castelein; Michel Van Camp; Mauro Andrade De Sousa; Rodrigo Lima Melhorato; Chunjian Li; Jinyi Xu; Duowu Su; Shuqing Wu; Hua Hu; Kang Wu; Gang Li; Zhe Li; Wen-Chi Hsieh; Pecný Vojtech Pálinkás; Jakub Kostelecký; Jaakko Mäkinen; Jyri Näränen; Sébastien Merlet; Franck Pereira Dos Santos; Pierre Gillot; Jacques Hinderer; Jean-Daniel Bernard; Nicolas Le Moigne; Benjamin Fores; Olga Gitlein; Manuel Schilling; Reinhard Falk
The determination of the Avogadro constant from two selected silicon crystals is described. The density, molar mass, and lattice spacing of the two crystals were measured at NMU, PTB, IRMM, IMGC, and NIST. When all the data are combined, it leads to the Avogadro constant of 6.022 1353 (21) times 1023 mol-1 with a relative combined standard uncertainty of 3.4 times 10-7
conference on precision electromagnetic measurements | 2016
Naoki Kuramoto; Lulu Zhang; Shigeki Mizushima; Kazuaki Fujita; Yasushi Azuma; Akira Kurokawa; Kenichi Fujii
Like all the previous International Comparisons of Absolute Gravimeters (ICAGs) the sixth, ICAG-2001, was held at the Bureau International des Poids et Mesures (BIPM). Major improvements in the 2001 campaign were a new measurement strategy using the absolute gravimeters to measure the ties of the gravity network, new sites constructed at the BIPM, improved relative measurements of the ties and gravity gradients, and combined adjustment of the absolute and relative data, realized using new software with a novel data weighting and rejection scheme. The g-values at four sites of the BIPM were measured with an uncertainty of 6 μGal. Good agreement was obtained between the results of the absolute and relative measurements of the ties of the gravity network. The final mean gvalue obtained at the reference site A was 7 μGal less than that obtained in the previous comparison, ICAG-97.
Collaboration
Dive into the Shigeki Mizushima's collaboration.
National Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputs