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Featured researches published by Shimizu Tasuku.


Computers & Structures | 1987

Thermo-elastic analysis of thin film multilayer structure with a crack

Doi Hiroaki; Sakata Shinji; Sakamoto Tatsuji; Shimizu Tasuku

Abstract A post-processor which calculates the J - integral from the results of ADINA is developed and applied to cracks in thin film multilayer circuit boards for large-size computers. The relation between the J - integral and the material properties (Youngs modulus and the thermal expansion coefficient) of the conductor and the insulator of the circuit board is investigated.


Computers & Structures | 1983

Simplified analysis of plastic and stable crack growth

Sakata Shinji; Shimizu Tasuku; Hasegawa Kunio; Shida Shigeru

Abstract A simplified analysis model for the initiation of stable growth and the propagation of a surface crack is proposed. Surface crack growth behavior can be analyzed by two-dimensional flnite element analysis using the simplified model. This model is applied for the estimation of the penetration load on Type 304 stainless steel plate with a part-through notch.


Archive | 1983

DETECTION OF CRACK

Sakata Shinji; Hayashi Makoto; Satou Yoshimi; Shimizu Tasuku


Archive | 1982

Turbine rotary blade dovetail

Satou Yoshimi; Sakata Shinji; Shimizu Tasuku; Ikeuchi Kazuo


Archive | 1985

Heat treatment of welded structure

Sakata Shinji; Enomoto Kunio; Shimizu Tasuku; Sagawa Wataru; Sugihara Isao; Onishi Hajime; Takehara Hidetoshi; Ikegami Tsukasa


Archive | 1986

SEMICONDUCTOR LIGHT EMITTING DEVICE WITH OPTICAL FIBER

Shimaoka Makoto; Kumazawa Tetsuo; Sakamoto Tatsuji; Shimizu Tasuku; Adachi Eiichi


Archive | 1985

Method and device for detecting crack shape

Hayashi Makoto; Otaka Masahiro; Shimizu Tasuku


Archive | 1989

Flux meter and method for manufacturing it

Yoshimura Toshihiko; Shimizu Tasuku; Ishikawa Yuichi; Otaka Masahiro; Koguchi Yuko


Archive | 1986

PACKAGE SEALING STRUCTURE OF SEMICONDUCTOR DEVICE

Kojima Hiroyuki; Shimizu Tasuku


Archive | 2002

Method and apparatus for nondestructive inspection

Yoshimura Toshihiko; Ishikawa Yuichi; Otaka Masahiro; Shimizu Tasuku; Hasegawa Kunio; Oguchi Yuko; Hirano Akihiko

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