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Featured researches published by Shridhar Nath.


Archive | 1997

Optimization of Self-Nulling Eddy Current Probe for the Detection of Shallow Fatigue Cracks

Buzz Wincheski; Shridhar Nath; Sarit Sharma; John Simpson

The Self-Nulling Eddy Current Probe has been the focus of much research during the past several years [1–7]. Developed under NASA’s Airframe Structural Integrity Program, past research has focused on applying the Self-Nulling Probe technology to the inspection of damage to thin aluminum airframe skins. As a result of this work prototype fatigue crack detectors, single and multi-layer thickness gauges, and a system for the detection of cracks under installed fasteners have been developed[l–2,5–7]. The probe has also been successful at detecting surface flaws in thick bulk materials, for which a commercial instrument has been produced and marketed by Kramer Branson, Inc.-This paper will explore the fatigue crack detection mechanism of the Self-Nulling Probe for shallow flaws in thick materials as compared to that of through cracks in thin skins. The resulting change in the performance of the Self-Nulling Probe will then be detailed, and proposed modifications to optimize the performance of the probe for the detection of shallow fatigue cracks enumerated.


Archive | 1997

Characteristics of Frequency Domain Spectrum of Self-Nulling Eddy Current Probe Output

Min Namkung; Shridhar Nath; J.P. Fulton

Since its introduction several years ago, the self-nulling eddy current probe [1–3] technology has been one of the focal points of the aging aircraft related R&D effort. Numerous application areas have broadened the scope of the probe which has also helped in better understanding the underlying principle. As the technology matures, however, deeper understanding on the various details related to the self nulling effect is needed to overcome difficulties associated with the current field tests and expand its application areas. A particular problem to be addressed is in differentiating the effect of small, shallow surface cracks from that of probe wobble during automated data acquisition operation.


Archive | 1995

Eddy Current Method for Fatigue Testing

John Simpson; James P. Fulton; Russell A. Wincheski; Ronald G. Todhunter; Min Namkung; Shridhar Nath


Archive | 1996

Flux focusing eddy current probe

John Simpson; C. Gerald Clendenin; James P. Fulton; Russell A. Wincheski; Ronald G. Todhunter; Min Namkung; Shridhar Nath


Archive | 1994

Rotating flux-focusing eddy current probe for flaw detection

Russell A. Wincheski; James P. Fulton; Shridhar Nath; John Simpson; Min Namkung


Archive | 1995

Radially focused eddy current sensor for detection of longitudinal flaws in metallic tubes

Russell A. Wincheski; John Simpson; James P. Fulton; Shridhar Nath; Ronald G. Todhunter; Min Namkung


Archive | 1997

Thickness Gauging of Single-Layer Conductive Materials with Two-Point Non Linear Calibration Algorithm

James P. Fulton; Min Namkung; John Simpson; Russell A. Wincheski; Shridhar Nath


Archive | 1994

Detection of Fatigue Cracks at Rivets with Self-Nulling Probe

Buzz Wincheski; Jim Fulton; Shridhar Nath; Min Namkung


Archive | 1992

Finite element and boundary element analysis of electromagnetic NDE phenomena

Shridhar Nath


Archive | 1994

Corrosion Detection in Airframes Using a New Flux-Focusing Eddy Current Probe

James P. Fulton; Buzz Wincheski; Shridhar Nath; Min Namkung

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Min Namkung

Langley Research Center

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Jim Fulton

Langley Research Center

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