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Publication
Featured researches published by Shuichi Yamazaki.
Journal of Applied Physics | 1999
Hiroyasu Fujii; Shuichi Yamazaki; Hiroaki Masui; Morio Shiozaki; Takeo Nagashima; Hisashi Kobayashi
The oxide film formed during secondary recrystallization annealing of grain-oriented 3% Si steel using aluminum nitride as an inhibitor was investigated by x-ray diffraction analysis (XRD), glow discharge optical emission spectrometry (GD-OES), and quantitative chemical analysis (CA) in order to clarify the structure and the formation process. Spinel (MgAl2O4) was identified in addition to forsterite (Mg2SiO4) by XRD. From the consideration on the basis of the element distribution of Mg, Si, Al in the glass film and the quantitative correlation between the amount of spinel and that of forsterite, it was concluded that spinel was formed by the substitution reaction of Si in forsterite film for Al generated by decomposition of AIN.
Archive | 1999
Hiroshi Kihira; Masao Kikuchi; Shuichi Yamazaki; 修一 山崎; 寛 紀平; 正夫 菊池
Archive | 1992
Hiroaki Masui; Morio Shiozaki; Nobuyuki Takahashi; Hisashi Kabayashi; Takeo Nagashima; Shuichi Yamazaki; Hiroyasu Fujii
Archive | 2000
Shuichi Yamazaki; 修一 山崎
Archive | 1993
Shuichi Yamazaki; Hiroyasu Fujii; Takeo Nagashima; Yoshiyuki Ushigami; Osamu Tanaka; Katsurou Kuroki; Hiroaki Masui
Archive | 1999
Kenji Kosuge; Yosuke Kurosaki; Hidekazu Nanba; Shuichi Yamazaki; 健司 小菅; 修一 山崎; 英一 難波; 洋介 黒崎
Archive | 1993
Takao Kanai; Kei Tanemoto; Shuichi Yamazaki; Takeo Nagashima
Archive | 2000
Hideki Ando; Kenichiro Asako; Junji Hobo; Shuichi Yamazaki; 淳治 保母; 英樹 安藤; 修一 山崎; 健一郎 浅古
Archive | 2000
Shuichi Yamazaki; 修一 山崎
Archive | 1995
Shuichi Yamazaki; Yoshiyuki Ushigami; Hiroyasu Fujii; Kenichi Murakami
