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Journal of Lightwave Technology | 1996

Low-loss passive polymer optical waveguides with high environmental stability

Mitsuo Usui; Makoto Hikita; Toshio Watanabe; Michiyuki Amano; Shungo Sugawara; Shoichi Hayashida; Saburo Imamura

Deuterated polysiloxane with high transparency and high thermal stability was newly synthesized for use as optical waveguide material. Single-mode channel waveguides using the polymer were fabricated by conventional photolithography and dry etching. The propagation loss of the channel waveguides was measured and found to be 0.17 dB/cm at 1.31 /spl mu/m and 0.43 dB/cm at 1.55 /spl mu/m. The thermal and environmental stability of the waveguides was demonstrated by the fact that the propagation loss remained unchanged after tests at 200/spl deg/C for 30 min, at 120/spl deg/C for 1000 h, and at 75/spl deg/C and 90% RH for 1000 h.


Japanese Journal of Applied Physics | 1982

Chloromethylated Polystyrene as Deep UV and X-Ray Resist

Saburo Imamura; Shungo Sugawara

The deep uv and X-ray lithographic characteristics of high-performance negative electron resist chloromethylated polystyrene (CMS) were investigated. The sensitivity and resolution of a series of CMSs synthesized from nearly monodispersed polystyrene were evaluated as functions of molecular parameters. In CMS with a molecular weight of 1.8×105 showing a resolution better than 1.5 µm, a high sensitivity of 29 mJ/cm2 to X-rays and a sensitivity to deep uv about 40 times higher than that of PMMA was achieved. This high sensitivity is attributed to the high reactivity of the chloromethyl group, as verified by the high G value of CMS (5.4), 50 times larger than that of polystyrene. In contrast to most negative resists, where oxygen in air depresses the sensitivity, the sensitivity of CMS is hardly affected by the atmosphere. The sensitivity and resolution in the deep uv system are particularly affected by light absorption, because CMS exhibits strong absorption between 200 to 300 nm.


Journal of The Electrochemical Society | 1977

Poly (Fluoro Methacrylate) as Highly Sensitive, High Contrast Positive Resist

Masami Kakuchi; Shungo Sugawara; Kei Murase; Kentaro Matsuyama


Journal of Applied Polymer Science | 1982

High performance electron negative resist, chloromethylated polystyrene. A study on molecular parameters

Saburo Imamura; Toshiaki Tamamura; Katsuhiro Harada; Shungo Sugawara


Archive | 1976

Forming method for fine resist patterns

Masami Kakuchi; Gentarou Matsuyama; Hiroshi Murase; Shungo Sugawara


Archive | 1977

Polymeric resist mask composition

Masami Kakuchi; Shungo Sugawara; Kei Murase; Kentaro Matsuyama


Journal of The Electrochemical Society | 1977

Poly(vinylethers) as X‐Ray Resists

Saburo Imamura; Shungo Sugawara; Kei Murase


Journal of The Electrochemical Society | 1984

Crosslinking Reactions in Negative Electron Resists Composed of Halogenated Aromatic Polymers

Saburo Imamura; Toshiaki Tamamura; Ken Sukegawa; Osamu Kogure; Shungo Sugawara


Journal of The Electrochemical Society | 1982

Resolution Limit of Negative Electron Resist Exposed on a Thin Film Substrate

Toshiaki Tamamura; Ken Sukegawa; Shungo Sugawara


Archive | 1977

Formation of high polymer film materials and their patterns

Hiroshi Murase; Shungo Sugawara; Takeshi Sukegawa

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Michiyuki Amano

Nippon Telegraph and Telephone

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Osamu Kogure

Nippon Telegraph and Telephone

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Toshio Watanabe

Nippon Telegraph and Telephone

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