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Dive into the research topics where Simon-Frédéric Desage is active.

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Featured researches published by Simon-Frédéric Desage.


7th International Precision Assembly Seminar (IPAS) | 2014

Control Methods in Microspheres Precision Assembly for Colloidal Lithography

Olivier Dellea; Olga Shavdina; Pascal Fugier; Philippe Coronel; Emmanuel Ollier; Simon-Frédéric Desage

Colloidal lithography based on the assembly of microspheres is a powerful tool for the creation of a large variety of two dimensional micro or nanostructures patterned. However very few studies examine the control, qualification and quantification of the ordering of the particles once deposited on the substrate. We have developed two unique methods working at microscopic and macroscopic scales, respectively called Microfixe® and Macrofixe®, for the analysis of grain morphology in the case of hexagonal closed packed (HCP) monolayers of spherical microparticles. The processing of the images taken at microscopic scale uses Delaunay triangulation and histograms of lengths and orientations of Delaunay triangles sides. At the macroscopic scale, six camera images are required of the sample illuminated under six different incidence angles. Image treatment consists in the comparison of the six images and eventually subdivision of these images to sharpen the analysis. At the end, the two softwares constitute artificial images of particle deposit, giving at microscopic and macroscopic scales significant information about grain size, grain morphology, orientation distributions, defaults (voids, stacking)…With these two new control methods, colloidal lithography is emerging as an industrial process.


electronic imaging | 2015

Extended visual appearance texture features

Simon-Frédéric Desage; Gilles Pitard; Maurice Pillet; Hugues Favreliere; Jean-Luc Maire; Fabrice Frelin; Serge Samper; Gaëtan Le Goïc

The research purpose is to improve surface characterization based on what is perceived by human eye and on the 2006 CIE report. This report defines four headings under which possible measures might be made: color, gloss, translucency and texture. It is therefore important to define parameters able to discriminate surfaces, in accordance with the perception of human eye. Our starting point in assessing a surface is the measurement of its reflectance (acquisition of ABRDF for visual rendering), i.e. evaluate a set of images from different angles of lighting rather than a single image. The research question is how calculate, from this enhanced information, some discriminating parameters. We propose to use an image processing approach of texture that reflects spatial variations of pixel for translating changes in color, material and relief. From a set of images from different angles of light, we compute associated Haralick features for constructing new (extended) features, called Bidimensional Haralick Functions (BHF), and exploit them for discriminating surfaces. We propose another framework in three parts such as color, material and relief.


Twelfth International Conference on Quality Control by Artificial Vision 2015 | 2015

Syntactic texture and perception for a new generic visual anomalies classification

Simon-Frédéric Desage; Gilles Pitard; Maurice Pillet; Hugues Favreliere; Jean Luc Maire; Fabrice Frelin; Serge Samper; Gaëtan Le Goïc

The research purpose is to improve aesthetic anomalies detection and evaluation based on what is perceived by human eye and on the 2006 CIE report.1 It is therefore important to define parameters able to discriminate surfaces, in accordance with the perception of human eye. Our starting point in assessing aesthetic anomalies is geometric description such as defined by ISO standard,2 i.e. traduce anomalies description with perception words about texture divergence impact. However, human controllers observe (detect) the aesthetic anomaly by its visual effect and interpreter for its geometric description. The research question is how define generic parameters for discriminating aesthetic anomalies, from enhanced information of visual texture such as recent surface visual rendering approach. We propose to use an approach from visual texture processing that quantify spatial variations of pixel for translating changes in color, material and relief. From a set of images from different angles of light which gives us access to the surface appearance, we propose an approach from visual effect to geometrical specifications as the current standards have identified the aesthetic anomalies.


Optical Measurement Systems for Industrial Inspection IX | 2015

Discrete Modal Decomposition for surface appearance modelling and rendering

Gilles Pitard; Gaëtan Le Goïc; Hugues Favreliere; Serge Samper; Simon-Frédéric Desage; Maurice Pillet

Controlling surface appearance has become essential in the supplier/customer relationship. In this context, many industries have implemented new methods to improve the sensory inspection, particularly in terms of variability. A trend is to develop both hardware and methods for moving towards the automation of appearance inspection and analysis. If devices inspired from dimensional control solutions generally allow to identify defects far apart the expected quality of products, it do not allow to quantify finely appearance anomalies, and decide on their acceptance. To address this issue, new methods devoted to appearance modelling and rendering have been implemented, such as the Reflectance Transformation Imaging (RTI) technique. By varying the illumination positions, the RTI technique aims at enriching the classical information conveyed by images. Thus each pixel is described by a set of values rather than one value classically; each value corresponding to a specific illumination position. This set of values could be interpolated or approximated by a continuous model (function), associated to the reflectance of the pixel, generally based on a second order polynomial (namely, Polynomial Texture Mapping Technique). This paper presents a new approach to evaluate this information from RTI acquisitions. A modal projection based on dynamics (Discrete Modal Decomposition) is used to estimate surface reflectance on each measurement point. After presenting the acquisition device, an application on an industrial surface is proposed in order to validate the approach, and compare it to the more classical polynomial transformation. Results show that the proposed projection basis not only provides closer assessment of surface reflectance (modelling) but also yields to a more realistic rendering.


machine vision applications | 2017

Discrete Modal Decomposition: a new approach for the reflectance modeling and rendering of real surfaces

Gilles Pitard; Gaëtan Le Goïc; Alamin Mansouri; Hugues Favreliere; Simon-Frédéric Desage; Serge Samper; Maurice Pillet

Reflectance Transformation Imaging is a recent technique allowing for the measurement and the modeling of one of the most influential parameters on the appearance of a surface, namely the angular reflectance, thanks to the change in the direction of the lighting during acquisition. From these photometric stereo images (discrete data), the angular reflectance is modeled to allow both interactive and continuous relighting of the inspected surface. Two families of functions, based on polynomials and on hemispherical harmonics, are cited and used in the literature at this aim, respectively, associated to the PTM and HSH techniques. In this paper, we propose a novel method called Discrete Modal Decomposition (DMD) based on a particular and appropriate Eigen basis derived from a structural dynamic problem. The performance of the proposed method is compared with the PTM and HSH results on three real surfaces showing different reflection behaviors. Comparisons are made in terms of both visual rendering and of statistical error (local and global). The obtained results show that the DMD is more efficient in that it allows for a more accurate modeling of the angular reflectance when light–matter interaction is complex such as the presence of shadows, specularities and inter-reflections.


Proceedings of the National Academy of Sciences of the United States of America | 2014

Macroscopic exploration and visual quality inspection of thin film deposit.

Simon-Frédéric Desage; Gilles Pitard; Hugues Favreliere; Maurice Pillet; Olivier Dellea; Pascal Fugier; Philippe Coronel; Emmanuel Ollier

Micro/nanotechnologies evolve causing an evolution of surface characterization systems of thin films. Today, these systems are not adapted to the future needs (or current) to characterize and qualify a large effective area within industrial production. This concerns the thin film active layers or simple mask for structuring the surface. This paper proposes a quality control method for thin films of self-assembled particles and high quality. This method is founded on the intersection of several skills available in our laboratories: Industrial process of visual inspection, optical methods for quality control (large area relative to the state of the art) and advances in micro/nanotechnology (CEA/Liten).


IFIP Advances in Information and Communication Technology | 2014

Visual quality inspection and fine anomalies: methods and application

Simon-Frédéric Desage; Gilles Pitard; Maurice Pillet; Hugues Favreliere; Fabrice Frelin; Serge Samper; Gaëtan Le Goïc; Laurent Gwinner; Pierre Jochum

This study develops a surface inspection methodology used to detect complex geometry products and metallic reflective surfaces imperfections. This work is based on combination of three complementary methods: an optical one (structured light information), an algorithmic one (data processing) and a statistical one (parameters processing). A usual industrial application illustrates this processing.


Archive | 2015

Contraintes et opportunités pour l'automatisation de l'inspection visuelle au regard du processus humain

Simon-Frédéric Desage


Archive | 2016

Method and apparatus for characterising a diffracting surface

Olivier Dellea; Simon-Frédéric Desage; Pascal Fugier


QUALITA' 2015 | 2015

Vers une automatisation du contrôle visuel des produits

Simon-Frédéric Desage; Gilles Pitard; Hugues Favreliere; Maurice Pillet; Jean Luc Maire; Fabrice Frelin; Serge Samper; Gaëtan Le Goïc

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Gilles Pitard

Norwegian University of Science and Technology

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Gaëtan Le Goïc

Centre national de la recherche scientifique

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Olga Shavdina

Centre national de la recherche scientifique

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