Soon-Jong Lee | Researchain

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Publication

Featured researches published by Soon-Jong Lee.

Archive | 2007

Apparatus and method for inspecting edge defect and discoloration of glass substrate

Soon-Jong Lee; Bong-Joo Woo

Archive | 2009

Glass waviness inspection device and inspection method thereof

Soon-Jong Lee; Bong-Joo Woo; Seong-Jin Choi; Kyoung-Soo Lee

Archive | 2008

Wafer testing apparatus and processing equipment having the same

Soon-Jong Lee; Bong-Joo Woo

Archive | 2012

SYSTEM AND METHOD FOR MEASURING IRREGULARITY OF GLASS SUBSTRATE

Soon-Jong Lee; 이순종; Bong-Joo Woo; 우봉주; Byoung-Chan Park; 박병찬; Seong-Jin Choi; 최성진; Jae-Hoon Chung; 정재훈

Archive | 2011

System and method of measuring irregularity of a glass substrate

Soon-Jong Lee; Bong-Joo Woo; Byoung-Chan Park; Seong-Jin Choi; Jae-Hoon Chung

Archive | 2015

SYSTEM AND METHOD OF CERTIFICATING A GENUINE ARTICLE

Soon-Jong Lee; Dong-seok Sinmyung Apt. Lee; Hak-Kwon Kim

Archive | 2013

Defect inspection system for inspecting object having irregular patterns

Soon-Jong Lee; 이순종; Bong-Joo Woo; 우봉주; Seong-Jin Choi; 최성진; Jun-yeon Won; 원준연

Archive | 2013

Système d'inspection d'un défaut pour inspecter un objet ayant des structures irrégulières

Soon-Jong Lee; 이순종; Bong-Joo Woo; 우봉주; Seong-Jin Choi; 최성진; Jun-yeon Won; 원준연

Archive | 2012

SYSTÈME ET PROCÉDÉ POUR MESURER UNE NON UNIFORMITÉ DE SUBSTRAT EN VERRE

Soon-Jong Lee; 이순종; Bong-Joo Woo; 우봉주; Byoung-Chan Park; 박병찬; Seong-Jin Choi; 최성진; Jae-Hoon Chung; 정재훈

Archive | 2011

유리 기판의 불균일도 측정 시스템 및 방법

Soon-Jong Lee; 이순종; Bong-Joo Woo; 우봉주; Byoung-Chan Park; 박병찬; Seong-Jin Choi; 최성진; Jae-Hoon Chung; 정재훈

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정재훈

LG Electronics

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Archive Network Publication Hotspot Collaboration

Network

Latest external collaboration on country level. Dive into details by clicking on the dots.

Hotspot

Dive into the research topics where Soon-Jong Lee is active.

Publication

Featured researches published by Soon-Jong Lee.

Apparatus and method for inspecting edge defect and discoloration of glass substrate

Glass waviness inspection device and inspection method thereof

Wafer testing apparatus and processing equipment having the same

SYSTEM AND METHOD FOR MEASURING IRREGULARITY OF GLASS SUBSTRATE

System and method of measuring irregularity of a glass substrate

SYSTEM AND METHOD OF CERTIFICATING A GENUINE ARTICLE

Defect inspection system for inspecting object having irregular patterns

Système d'inspection d'un défaut pour inspecter un objet ayant des structures irrégulières

SYSTÈME ET PROCÉDÉ POUR MESURER UNE NON UNIFORMITÉ DE SUBSTRAT EN VERRE

유리 기판의 불균일도 측정 시스템 및 방법

Collaboration

Dive into the Soon-Jong Lee's collaboration.