Sosan Cheon

How to Reliably Determine the Complex Refractive Index (RI) of Graphene by Using Two Independent Measurement Constraints

Reliable determination of the complex refractive index (RI) of graphene inherently requires two independent measurement realizations for two independent unknowns of the real (nG) and imaginary (kG) components, i.e., RI = nG + i kG. Thus, any single set of measurement realization provides only one constraint that is insufficient to uniquely determine the complex RI of graphene. Tandem uses of two independent measurement techniques, namely the surface plasmon resonance (SPR) angle detection and the attenuated total reflection (ATR) intensity measurement, allow for the unique determination of the complex RI of CVD-synthesized graphene. The presently measured graphene RI is determined to be 2.65 + 1.27i for the E-field oscillating parallel to graphene at 634 nm wavelength, with variations for different numbers of L (1, 3 and 5) remaining within ±3%. Thus, our demonstration results for the specified wavelength serve as an impetus to suggest the need for two independent measurement techniques in determining both the real and imaginary RI values for graphene. Additional efforts have been made to characterize graphene layers using the density function theory (DFT): this calculation provides RIG = 2.71 + 1.41i.

How to optically count graphene layers.

The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers.

In-Plane Thermal Conductivity of Polycrystalline Chemical Vapor Deposition Graphene with Controlled Grain Sizes

Manipulation of the chemical vapor deposition graphene synthesis conditions, such as operating P, T, heating/cooling time intervals, and precursor gas concentration ratios (CH4/H2), allowed for synthesis of polycrystalline single-layered graphene with controlled grain sizes. The graphene samples were then suspended on 8 μm diameter patterned holes on a silicon-nitride (Si3N4) substrate, and the in-plane thermal conductivities k(T) for 320 K < T < 510 K were measured to be 2660-1230, 1890-1020, and 680-340 W/m·K for average grain sizes of 4.1, 2.2, and 0.5 μm, respectively, using an opto-thermal Raman technique. Fitting of these data by a simple linear chain model of polycrystalline thermal transport determined k = 5500-1980 W/m·K for single-crystal graphene for the same temperature range above; thus, significant reduction of k was achieved when the grain size was decreased from infinite down to 0.5 μm. Furthermore, detailed elaborations were performed to assess the measurement reliability of k by addressing the hole-edge boundary condition, and the air-convection/radiation losses from the graphene surface.

Wetting and Evaporative Aggregation of Nanofluid Droplets on CVD-Synthesized Hydrophobic Graphene Surfaces

The wetting and evaporative aggregation of alumina nanofluids (Al2O3) are examined for CVD-synthesized graphene-coated (GC) surfaces that are known as strongly hydrophobic (θcontact ≈ 90°). Our findings are compared to those associated with a hydrophilic cover glass (CG) substrate (θcontact ≈ 45°). The nanofluidic self-assemblies on the GC substrate are elaborately characterized in terms of the droplet wetting/crack formation, the particle migration time over the evaporative time (CR), the Derjaguin-Landau-Verwey-Overbeek forces (FDLVO), and the relative thermal conductivity (KR). The GC substrate forms relatively thicker and larger cracks and requires a longer evaporation time. Both the GC and CG substrates share approximately the same time constant CR, which suggests the formation of coffee-ring patterns for both substrates. The GC shows negative FDLVO, which implies a repulsive force between the nanoparticles and the substrate, and the CG shows a positive FDLVO of attraction. Furthermore, a more than 3 order of magnitude larger thermal conductivity of GC compared to that of CG drives significantly different particle/fluid motions near the drop edge areas between the two substrates.

Enhanced Thermoelectric Conversion Efficiency of CVD Graphene with Reduced Grain Sizes

The grain size of CVD (Chemical Vapor Deposition) graphene was controlled by changing the precursor gas flow rates, operation temperature, and chamber pressure. Graphene of average grain sizes of 4.1 µm, 2.2 µm, and 0.5 µm was synthesized in high quality and full coverage. The possibility to tailor the thermoelectric conversion characteristics of graphene has been exhibited by examining the grain size effect on the three elementary thermal and electrical properties of σ, S, and k. Electrical conductivity (σ) and Seebeck coefficients (S) were measured in a vacuum for supported graphene on SiO2/Si FET (Field Effect Transistor) substrates so that the charge carrier density could be changed by applying a gate voltage (VG). Mobility (µ) values of 529, 459, and 314 cm2/V·s for holes and 1042, 745, and 490 cm2/V·s for electrons for the three grain sizes of 4.1 µm, 2.2 µm, and 0.5 µm, respectively, were obtained from the slopes of the measured σ vs. VG graphs. The power factor (PF), the electrical portion of the thermoelectric figure of merit (ZT), decreased by about one half as the grain size was decreased, while the thermal conductivity (k) decreased by one quarter for the same grain decrease. Finally, the resulting ZT increased more than two times when the grain size was reduced from 4.1 µm to 0.5 µm.