Stefan Katletz

Polarization sensitive terahertz imaging: Detection of birefringence and optical axis

We present a practicable way to take advantage of the spectral information contained in a broadband terahertz pulse for the determination of birefringence and orientation of the optical axis in a glass fiber reinforced polymer with a single measurement. Our setup employs circularly polarized terahertz waves and a polarization-sensitive detector to measure both components of the electromagnetic field simultaneously. The anisotropic optical parameters are obtained from an analysis of the phase and frequency resolved components of the terahertz field. This method shows a high tolerance against the skew of the detection axes and is also independent of a reference measurement.

Efficient terahertz en-face imaging

In this work, we develop a pulsed terahertz imaging system in reflection geometry, where due to scanning of the terahertz beam neither the sample nor the emitter and detector have to be moved. We use a two mirror galvanoscanner for deflecting the beam, in combination with a single rotationally symmetric focusing lens. In order to efficiently image planar structures, we develop an advanced scanning routine that resolves all bending effects of the imaging plane already during measurement. Thus, the measurement time is reduced, and efficient imaging of surfaces and interfaces becomes possible. We demonstrate the potential of this method in particular for a plastic-metal composite sample, for which non-destructive evaluation of an interface is performed.

Advanced birefringence measurements in standard terahertz time-domain spectroscopy

Polarization-sensitive (PS) terahertz (THz) technology can be used for investigating anisotropic materials that are opaque for visible light. A full characterization of an anisotropic material requires the extraction of the birefringence as well as the orientation of the optical axis from the measurement data. We present an approach based on THz time-domain spectroscopy (TDS) that exploits the spectral content of the THz signal for determining these two parameters from only two measurements. In contrast to an earlier approach with a more sophisticated PS-THz system and quasi-circularly polarized THz radiation, now a simple standard THz-TDS system can be employed. After a description of the mathematical model for data analysis we demonstrate the applicability of our method for a lithium niobate crystal and furthermore for a glass-fiber reinforced polymer sample, for which the orientation of the optical axis and birefringence are obtained in a spatially resolved way, showing the potential of the method also for PS-THz imaging. As no specialized setup or components are required, our approach can be easily and extensively applied for the analysis of anisotropic samples at THz frequencies.

Terahertz time-domain spectroscopy for monitoring the curing of dental composites.

We apply terahertz (THz) time-domain spectroscopy for monitoring the curing process of three different light-curing dental composites. Exact knowledge of the sample thickness is required for a precise determination of the THz dielectric parameters, as the materials exhibit shrinkage when they are cured. We find very small but significant changes of the THz refractive index and absorption coefficient during stepwise light exposure. The changes in the refractive index are correlated with changes in the density of the materials. Furthermore, the refractive index and the sample thickness are found to give the most reliable result for monitoring the curing process of the dental composites.

Phase correction for rapid en-face scanning with pulsed terahertz radiation

An enhanced measurement system for terahertz pulsed imaging is presented that is capable of effectively performing en-face and three-dimensional scans of planar and curved surfaces. The bending of the scanning surface in one direction is compensated by synchronously advancing the mechanical delay time with the deflection of a scanning mirror. The second scanning mirror for the fast scanning direction forms a telecentric system and does not exhibit phase distortion.