Stephan Lutgen

On the importance of radiative and Auger losses in GaN-based quantum wells

Fully microscopic many-body models are used to study the importance of radiative and Auger carrier losses in InGaN∕GaN quantum wells. Auger losses are found to be negligible in contrast to recent speculations on their importance for the experimentally observed efficiency droop. Good agreement with experimentally measured threshold losses is demonstrated. The results show no significant dependence on details of the well alloy profile.

8-W high-efficiency continuous-wave semiconductor disk laser at 1000 nm

We demonstrate more than 8-W continuous-wave output power with good beam quality (M2<1.8) from an optically pumped semiconductor disk laser. The combination of low threshold density of 470 W/cm2 and high differential efficiency of 60% results in an optical-to-optical conversion efficiency of 46% for this high output level. Good epitaxial quality and low thermal resistance allow the scaling of output power with pump spot area.

500 nm electrically driven InGaN based laser diodes

Based on recent improvements of growth of In-rich InGaN quantum wells with low defect density, we demonstrate current driven InGaN laser diodes at wavelengths as long as 500 nm. The laser structures are grown on c-plane GaN substrate and are processed as broad oxide-insulated stripe laser diodes. We discuss the impact of the piezoelectric field on the emission energy of long wavelength laser diodes for this growth orientation. The combination of low threshold current density of 8.2 kA/cm2 with high slope efficiency of 650 mW/A enables high output powers up to several tens of milliwatts.

True Green Laser Diodes at 524 nm with 50 mW Continuous Wave Output Power on c-Plane GaN

We pushed direct green laser diodes towards longer wavelengths at 524–532 nm based on improvements of epitaxial design and material quality on c-plane GaN substrate. Mounted ridge laser diodes show significant performance improvement in cw operation. For 524 nm laser, wall plug efficiency up to 2.3% at 50 mW optical output power is achieved. In pulse mode operation we demonstrate broad-area test lasers with an emission wavelength of 531.7 nm. Nonpolar and polar substrates are compared with respect to indium content in InGaN quantum wells. The limiting factors for achieving longer wavelengths and better performance of green lasers are discussed from this viewpoint.

Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.

In scanning transmission electron microscopy using a high-angle annular dark field detector, image intensity strongly depends on specimen thickness and composition. In this paper we show that measurement of image intensities relative to the intensity of the incoming electron beam allows direct comparison with simulated image intensities, and thus quantitative measurement of specimen thickness and composition. Simulations were carried out with the frozen lattice and absorptive potential multislice methods. The radial inhomogeneity of the detector was measured and taken into account. Using a focused ion beam (FIB) prepared specimen we first demonstrate that specimen thicknesses obtained in this way are in very good agreement with a direct measurement of the thickness of the lamella by scanning electron microscopy in the FIB. In the second step we apply this method to evaluate the composition of Al(x)Ga(1-x)N/GaN layers. We measured ratios of image intensities obtained in regions with unknown and with known Al-concentration x, respectively. We show that estimation of the specimen thickness combined with evaluation of intensity ratios allows quantitative measurement of the composition x. In high-resolution images we find that the image intensity is well described by simulation if the simulated image is convoluted with a Gaussian with a half-width at half-maximum of 0.07 nm.

Composition mapping in InGaN by scanning transmission electron microscopy

We suggest a method for chemical mapping that is based on scanning transmission electron microscopy (STEM) imaging with a high-angle annular dark field (HAADF) detector. The analysis method uses a comparison of intensity normalized with respect to the incident electron beam with intensity calculated employing the frozen lattice approximation. This procedure is validated with an In(0.07)Ga(0.93)N layer with homogeneous In concentration, where the STEM results were compared with energy filtered imaging, strain state analysis and energy dispersive X-ray analysis. Good agreement was obtained, if the frozen lattice simulations took into account static atomic displacements, caused by the different covalent radii of In and Ga atoms. Using a sample with higher In concentration and series of 32 images taken within 42 min scan time, we did not find any indication for formation of In rich regions due to electron beam irradiation, which is reported in literature to occur for the parallel illumination mode. Image simulation of an In(0.15)Ga(0.85)N layer that was elastically relaxed with empirical Stillinger-Weber potentials did not reveal significant impact of lattice plane bending on STEM images as well as on the evaluated In concentration profiles for specimen thicknesses of 5, 15 and 50 nm. Image simulation of an abrupt interface between GaN and In(0.15)Ga(0.85)N for specimen thicknesses up to 200 nm showed that artificial blurring of interfaces is significantly smaller than expected from a simple geometrical model that is based on the beam convergence only. As an application of the method, we give evidence for the existence of In rich regions in an InGaN layer which shows signatures of quantum dot emission in microphotoluminescence spectroscopy experiments.

InGaN laser diodes with 50 mW output power emitting at 515 nm

We demonstrate direct green laser operation from InGaN based diodes at wavelengths as long as 515.9 nm with 50 mW output power in pulse operation. A factor of ∼10 defect reduction for the In-rich InGaN quantum wells based on improvements of the epitaxial growth process and design of the active layers on c-plane GaN-substrates makes it possible to demonstrate laser operation at room temperature. Micrometer-scale photoluminescence mappings and electro-optical measurements confirm the reduction of nonradiative defects in the emitting layers. The 11 μm broad-area gain-guided laser structures were driven in pulse operation to minimize thermal effects and to accurately measure the laser temperature dependence. The threshold current density was ∼9 kA/cm2 and the fitted slope efficiency had a value of ∼130 mW/A for an optical output up to 50 mW.

Experimental and theoretical analysis of optically pumped semiconductor disk lasers

We describe the experimental cw power scaling of optically pumped semiconductor disk lasers OPS-DLs and give a detailed insight into the physical mechanism of this type of high-power surface-emitting semiconductor laser with external cavity. Minimizing the thermal resistance between active region and heat sink enables improved efficiency and gives access to high power and excellent beam quality of OPS-DL at 1000 nm. Results from initial numerical modeling are in good agreement with the experimental data, and show that thermal management is a critical parameter for the temperature-driven power shutoff in such devices. The computations are based on the macroscopic thermal transport, spatially resolved in both the radial and longitudinal directions, and coupled to the carrier density rate equations. A quantitative microscopic approach is used for the quantum-well gain and absorption dependence on wavelength, carrier density, and lattice temperature. The dependence of the computed output power on the substrate thickness and detuning are discussed.

True blue InGaN laser for pico size projectors

Red, green and blue semiconductor lasers are of great interest for full color laser projection. Mobile applications require low power consumption and very small laser devices. InGaN lasers are the best choice for the blue color in applications with output power requirements below 100mW: (1) they have much higher wall plug efficiencies than conventional blue frequency doubled diode pumped solid state lasers and (2) they are more compact than semiconductor IR lasers with subsequent second harmonic generation. We present blue InGaN lasers with high efficiency at a power consumption of several 100mW. Excellent epitaxial quality permits low internal losses. Threshold current densities and slope efficiencies are further optimized by improving the facet coating. The laser threshold current is as low as 25mA and the slope efficiency reaches 1W/A. We present a wall plug efficiency of 15% at output power levels of 60mW.

Recent results of blue and green InGaN laser diodes for laser projection

Mobile laser projection is of great commercial interest. Today, a key parameter in embedded mobile applications is the optical output power and the wall plug efficiency of blue and green lasers. We report on improvements of the performance of true blue riedge waveguide InGaN lasers at 452nm with cw-output power up to 800mW in overstress and mono mode operation up to 500mW in a temperatures range of 20°C to 80°C. We succeeded in high and almost temperature independent wall plug efficiencies >20% at stable output power levels from 200 to 500mW in cw-operation. Due to several improvements of our blue laser diodes we now estimate life times is in the order of 40khrs for 80mW output power in cw-operation at 40°C. Additional overstress degradation tests at power levels up to 200mW show a strong dependency of lifetime with output power. Furthermore, we present pioneering results on true green InGaN laser diodes on c-plane GaN-substrates. The technological challenge is to achieve In-rich InGaN-quantum wells with sufficiently high material quality for lasing. We investigated the competing recombination processes below laser threshold like nonradiative defect recombination by electro-optical measurements, such confirming that low defect densities are essential for stimulated emission. A model for alloy fluctuations in In-rich InGaN-MQWs based on spectral and time resolved photoluminescence measurements yields potential fluctuations in the order of E0=57meV for our blue laser diodes. To get a closer insight into the physics of direct green InGaN-Laser we investigated the inhomogeneous broadening of experimentally measured gain curves via Hakki-Paoli-measurements in comparison to calculated gain spectra based on microscopic theory showing the importance of strong LO-phonon coupling in this material system. Investigations of current dependent gain measurements and calculations yield a factor of 2 higher inhomogeneous broadening for our green lasers than for our blue laser diodes on c-plane GaN. Based on the improvements of the material quality and design we demonstrate true green InGaN-Laser in cw-operation at 522nm with more than 80mW output power on c-plane GaN. The combination of low laser threshold ~60-80mA, high slope efficiency ~0.65W/A and low operating voltage 6.9-6.4V of our green monomode RWG-Laser results in a high wall plug efficiency of 5-6% in a temperature range of 20-60°C.