Stephen J. Cook

Vacuum actuated test fixture

Bendable pin board test fixture

Enhanced grounding system for short-wire lengthed fixture

Probe contact through small amplitude vibration for bed of nails testing

Pre-loaded compression spring assembly

Board test fixture

Image scanner with intrinsic biasing of a scan head

IMPROVED PROBE CONTACT THROUGH SMALL AMPLITUDE VIBRATION FOR BED OF NAILS TESTING

Scanner carriage counterweight

Four-point planar mechanical mount with high precision