Publication


Featured researches published by Stephen Knight.


Symposium of Metrology 2006, Reliable Measurements for the Development of Mexico | 2006

Support of the National Institute of Standards and Technology to Industry The Semiconductor Industry

Joaquin; Stephen Knight


NIST Interagency/Internal Report (NISTIR) - 7321 | 2006

Semiconductor Microelectornics and Nanoelectronics Programs | NIST

Stephen Knight; Joaquin; Michele L. Buckley


NIST Interagency/Internal Report (NISTIR) - NISTIR7235 | 2005

Semiconductor Microelectronics and Naoelectronics Programs

Stephen Knight; Joaquin; Michele L. Buckley


NIST Interagency/Internal Report (NISTIR) - NISTIR7171 | 2005

Office of Microelectronics Programs - Programs, Activities, and Accomplishments | NIST

Stephen Knight; Joaquin; Michele L. Buckley


Journal of Vacuum Science & Technology B | 2005

Challenges in Metrology for the Semiconductor Industry

Stephen Knight; Joaquin


NIST Interagency/Internal Report (NISTIR) - 1534 | 2004

Semiconductor Microelectronics and Nanoelectronics Programs

Stephen Knight; Joaquin; Michele L. Buckley


Micro and Nano Technology in PIM 2004 New Industrial Technologies | 2004

Semiconductor Metrology Programs at NIST

Joaquin; Stephen Knight


GOMACTech-04: Transformational Technologies | 2004

Reliability Metrology for the Semiconductor Industry at NIST

Stephen Knight; John S. Suehle; Joaquin


NIST Interagency/Internal Report (NISTIR) - 6934 | 2003

Office of Microelectronics Programs 2003 Programs, Activities, and Accomplishments

Stephen Knight; Joaquin; Michele L. Buckley


NIST Interagency/Internal Report (NISTIR) - 6707 | 2001

Office of Microelectronics Programs Technical Accomplishments

Stephen Knight; Barbara J. Belzer

Researchain Logo
Decentralizing Knowledge