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Featured researches published by Steven Anton.


Nano Letters | 2009

Very Large Scale Integration of Nano-Patterned YBa2Cu3O7-delta Josephson Junctions in a Two-Dimensional Array

Shane A. Cybart; Steven Anton; Stephen M. Wu; John Clarke; Robert C. Dynes

Very large scale integration of Josephson junctions in a two-dimensional series-parallel array has been achieved by ion irradiating a YBa(2)Cu(3)O(7-delta) film through slits in a nanofabricated mask created with electron beam lithography and reactive ion etching. The mask consisted of 15820 high aspect ratio (20:1), 35 nm wide slits that restricted the irradiation in the film below to form Josephson junctions. Characterizing each parallel segment k, containing 28 junctions, with a single critical current I(ck) we found a standard deviation in I(ck) of about 16%.


Applied Physics Letters | 2012

Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations

Steven Anton; Christopher Nugroho; Jeff Birenbaum; S. R. O’Kelley; Vladimir Orlyanchik; Allison Dove; Gustaf Olson; Zack Yoscovits; James N. Eckstein; D. J. Van Harlingen; John Clarke

We demonstrate a spurious contribution to low-frequency critical current noise in Josephson junctions—normally attributed to charge trapping in the barrier—arising from temperature instabilities inherent in cryogenic systems. These temperature fluctuations modify the critical current via its temperature dependence. Cross-correlations between measured temperature and critical current noise in Al-AlOx-Al junctions show that, despite excellent temperature stability, temperature fluctuations induce observable critical current fluctuations. Particularly, because 1/f critical current noise has decreased with improved fabrication techniques in recent years, it is important to understand and eliminate this additional noise source.


Superconductor Science and Technology | 2013

Mean square flux noise in SQUIDs and qubits: numerical calculations

Steven Anton; I A B Sognnaes; Jeff Birenbaum; S. R. O’Kelley; Coenrad J. Fourie; John Clarke

The performance of SQUIDs and superconducting qubits based on magnetic flux is degraded by the presence of magnetic flux noise with a spectral density scaling approximately inversely with frequency. It is generally accepted that the noise arises from the random reversal of spins on the surface of the superconductors. We introduce a numerical method of calculating the mean square flux noise from independently fluctuating spins on the surface of thin-film loops of arbitrary geometry. By reciprocity, is proportional to ?B(r)2?, where B(r) is the magnetic field generated by a circulating current around the loop and r varies over the loop surface. By discretizing the loop nonuniformly, we efficiently and accurately compute the current distribution and resulting magnetic field, which may vary rapidly across the loop. We use this method to compute in a number of scenarios in which we systematically vary physical parameters of the loop. We compare our simulations to an earlier analytic result predicting that in the limit where the loop radius R is much greater than the linewidth W. We further show that the previously neglected contribution of edge spins to is significant?even dominant?in narrow-linewidth loops.


2013 IEEE 14th International Superconductive Electronics Conference (ISEC) | 2013

Magnetic field calculations in the vicinity of superconductive circuit structures

Coenrad J. Fourie; Steven Anton; John Clarke

Modeling the magnetic field generated by currents in thin-film superconducting structures is useful to a broad range of applications. Present methods calculate the magnetic field around such structures from two-dimensional current sheets. We present an efficient and accurate algorithm to calculate the magnetic field at arbitrary locations in three dimensions, both internal and external to the structures. We use a combination of FastHenry and InductEx to calculate the current density, from which we compute the magnetic field semi-analytically using Biot-Savarts law. As practical examples, we employ the algorithm to compute (i) the mean square flux noise in square SQUID and qubit loops and (ii) the dc bias current-induced magnetic field in real digital circuit layouts.


Physical Review Letters | 2013

Magnetic flux noise in dc SQUIDs: temperature and geometry dependence.

Steven Anton; Jeffrey Birenbaum; O'Kelley; Bolkhovsky; Danielle Braje; George Fitch; Neeley M; Hilton Gc; H. M. Cho; Irwin Kd; F. C. Wellstood; William D. Oliver; Alexander Shnirman; John Clarke


Bulletin of the American Physical Society | 2013

Flux noise in SQUIDs: Effects of deposited surface films

Sean O'Kelley; Steven Anton; Jeffrey Birenbaum; John Clarke; G. C. Hilton; H. M. Cho; K. D. Irwin; Christopher Nugroho; Allison Dove; Gustaf Olson; Zack Yoscovits; Vladimir Orlyanchik; D. J. Van Harlingen; James N. Eckstein


Bulletin of the American Physical Society | 2013

Phase versus flux coupling between resonator and superconducting flux qubit

Jeffrey Birenbaum; Sean O'Kelley; Steven Anton; Christopher Nugroho; Vladimir Orlyanchik; A.H. Dove; Zack Yoscovits; Gustaf Olson; D. J. Van Harlingen; James N. Eckstein; D.A. Braje; Richard Johnson; William D. Oliver; John Clarke


Bulletin of the American Physical Society | 2013

Geometry and temperature dependence of low-frequency flux noise in dc SQUIDs

Steven Anton; Jeffrey Birenbaum; Sean O'Kelley; D.S. Golubev; G. C. Hilton; H. M. Cho; K. D. Irwin; Vladimir Bolkhovsky; D.A. Braje; George Fitch; M. Neeley; Richard Johnson; William D. Oliver; F. c. Wellstood; John Clarke


Bulletin of the American Physical Society | 2012

Flux noise in SQUIDs: calculations of geometrical dependence

Sean O'Kelley; Keenan Pepper; Steven Anton; Jeffrey Birenbaum; John Clarke


Archive | 2011

Series-parallel two dimensional arrays of YBa2Cu3O7-delta thin film ion damage Josephson junctions

Jasper Drisko; Shane A. Cybart; Steven Anton; Stephen M. Wu; James R. Parker; Robert C. Dynes

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Jeffrey Birenbaum

Massachusetts Institute of Technology

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Stephen M. Wu

Argonne National Laboratory

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H. M. Cho

National Institute of Standards and Technology

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William D. Oliver

Massachusetts Institute of Technology

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G. C. Hilton

National Institute of Standards and Technology

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Jeff Birenbaum

University of California

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