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Susan E. Skrabanek

IBM

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Publication

Featured researches published by Susan E. Skrabanek.

Archive | 2005

Methods and apparatus for transferring data

Brian Richard Lepel; Randy Eugenio Oyarzabal; Susan E. Skrabanek

Archive | 2009

System and method to determine defect risks in software solutions

Kathryn A. Bassin; Howard M. Hess; Sheng Huang; Steven M. Kagan; Shao C. Li; Zhong J. Li; He H. Liu; Susan E. Skrabanek; Hua F. Tan; Jun Zhu

Archive | 2009

System and method for efficient creation and reconciliation of macro and micro level test plans

Kathryn A. Bassin; Sheng Huang; Steven M. Kagan; Shao C. Li; Zhong J. Li; He H. Liu; Susan E. Skrabanek; Hua F. Tan; Jun Zhu

Archive | 2007

Defect resolution methodology and target assessment process with a software system

Kathryn A. Bassin; Brian Richard Lepel; Warren James Leslie; Susan E. Skrabanek; Crystal Faye Springer; Nathan Gary Steffenhagen

Archive | 2005

Methods and apparatus for defect reduction analysis

Ronal Richard French; Brian Richard Lepel; Susan E. Skrabanek; Suzanne Elaine Smith; James Allen Walters

Archive | 2007

Defect Resolution Methodology Target Assessment Process

Kathryn A. Bassin; Brian Richard Lepel; Warren James Leslie; Susan E. Skrabanek; Crystal Faye Springer; Nathan Gary Steffenhagen

Archive | 2009

System and method for analyzing alternatives in test plans

Kathryn A. Bassin; Howard M. Hess; Steven M. Kagan; Shao C. Li; Zhong J. Li; He H. Liu; Susan E. Skrabanek; Hua F. Tan; Jun Zhu

Archive | 2007

Defect resolution methodology and data defects quality/risk metric model extension

Kathryn A. Bassin; Clyde J. Bearss; Linda Marie Clough; Susan E. Skrabanek; Crystal Faye Springer

Archive | 2006

Methods and apparatus for considering a project environment during defect analysis

Kathryn A. Bassin; Paul A. Beyer; Linda Marie Clough; Sandra R. Hardman; Deborah A. Masters; Susan E. Skrabanek; Nathan Gary Steffenhagen

Archive | 2012

System and method for system integration test (SIT) planning

Kathryn A. Bassin; Steven M. Kagan; Shao C. Li; Zhong J. Li; He H. Liu; Susan E. Skrabanek; Hua F. Tan; Jun Zhu

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Kathryn A. Bassin

IBM

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Steven M. Kagan

IBM

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He H. Liu

IBM

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Hua F. Tan

IBM

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Jun Zhu

IBM

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Shao C. Li

IBM

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Zhong J. Li

IBM

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Brian Richard Lepel

IBM

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Nathan Gary Steffenhagen

IBM

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Crystal Faye Springer

IBM

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