Szu-Hsian Lee

Effect of fabrication parameters on three-dimensional nanostructures of bulk heterojunctions imaged by high-resolution scanning ToF-SIMS.

Solution processable fullerene and copolymer bulk heterojunctions are widely used as the active layers of solar cells. In this work, scanning time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used to examine the distribution of [6,6]phenyl-C61-butyric acid methyl ester (PCBM) and regio-regular poly(3-hexylthiophene) (rrP3HT) that forms the bulk heterojunction. The planar phase separation of P3HT:PCBM is observed by ToF-SIMS imaging. The depth profile of the fragment distribution that reflects the molecular distribution is achieved by low energy Cs(+) ion sputtering. The depth profile clearly shows a vertical phase separation of P3HT:PCBM before annealing, and hence, the inverted device architecture is beneficial. After annealing, the phase segregation is suppressed, and the device efficiency is dramatically enhanced with a normal device structure. The 3D image is obtained by stacking the 2D ToF-SIMS images acquired at different sputtering times, and 50 nm features are clearly differentiated. The whole imaging process requires less than 2 h, making it both rapid and versatile.

Tuning the surface potential of gold substrates arbitrarily with self-assembled monolayers with mixed functional groups.

Alkanethiol anchored self-assembled monolayers (SAMs) on gold are widely used to immobilize and detect molecules including DNA and proteins. Most of these molecules are covalently bonded with the SAM on the Au surface and cannot be released easily. By using different functional groups, the interfacial charge of SAMs can be selected, and thus, they can be considered as adaptors for immobilizing and releasing materials selectively through electrostatic interaction under given conditions. In this work, as an additional factor to control the surface charge, SAMs with mixed functional groups are presented, and it is demonstrated that the isoelectric point (IEP) can be tailored by the ratio of functional groups. Using carboxylic acid- and amine-SAM on gold substrates as an example, isoelectric points (IEPs) from 3.5 to 6.5 can be obtained arbitrarily. The ratio between the functional groups on the surface was quantified by X-ray photoelectron spectrometry (XPS) and was found to be slightly different from the deposition solution. The homogeneous spatial distribution of the functional groups was determined with scanning electrical potential microscopy (SEPM). The interfacial charge of SAMs with mixed functional groups on gold was investigated by electrokinetic analysis in aqueous electrolyte solutions.

Tailoring the surface potential of gold nanoparticles with self-assembled monolayers with mixed functional groups

Self-assembled monolayer (SAM)-modified gold nanoparticles can be used to immobilize and transport molecules including DNA and proteins. However, these molecules are usually covalently bound to the surface and chemical reactions are required to cleave and release them. Therefore, immobilizing molecules using electrostatic interactions might be beneficial. In this work, Au nanoparticles modified by SAMs with mixed carboxylic acid and amine functional groups are presented. The surface potential and the iso-electric point (IEP) of the nanoparticles can be tailored by the ratio of these functional groups and arbitrary IEPs between 3.2 and 7.3 can be achieved. As a result, based on electrostatic interactions, molecules could be triggered to adsorb/desorb by changing the environmental pH around this tunable IEP. These engineered nanoparticles were synthesized in a single-phase system based on the reduction of HAuCl4 by NaBH4 in ethanol with a mixture of 16-mercaptohexadecanoic acid and 8-amino-1-octanethiol that forms the SAM on the synthesized nanoparticles. Transmission electron microscopy, X-ray photoelectron spectroscopy, and electrophoresis light scattering revealed the particle size, ratio of the functional groups, and zeta-potential of the particles as a function of pH, respectively.

Effect of surface chemical composition on the surface potential and iso-electric point of silicon substrates modified with self-assembled monolayers

Self-assembled monolayer (SAM)-modified nano-materials are a new technology to deliver drug molecules. While the majority of these depend on covalently immobilizing molecules on the surface, it is proposed that electrostatic interactions may be used to deliver drugs. By tuning the surface potential of solid substrates with SAMs, drug molecules could be either absorbed on or desorbed from substrates through the difference in electrostatic interactions around the selected iso-electric point (IEP). In this work, the surface of silicon substrates was tailored with various ratios of 3-aminopropyltrimethoxysilane (APTMS) and 3-mercaptopropyltrimethoxysilane (MPTMS), which form amine- and thiol-bearing SAMs, respectively. The ratio of the functional groups on the silicon surface was quantified by X-ray photoelectron spectrometry (XPS); in general, the deposition kinetics of APTMS were found to be faster than those of MPTMS. Furthermore, for solutions with high MPTMS concentrations, the relative deposition rate of APTMS increased dramatically due to the acid-base reaction in the solution and subsequent electrostatic interactions between the molecules and the substrate. The zeta potential in aqueous electrolytes was determined with an electro-kinetic analyzer. By depositing SAMs of binary functional groups in varied ratios, the surface potential and IEP of silicon substrates could be fine-tuned. For <50% amine concentration in SAMs, the IEP changed linearly with the chemical composition from <2 to 7.18. For higher amine concentrations, the IEP slowly increased with concentration to 7.94 because the formation of hydrogen-bonding suppressed the subsequent protonation of amines.

Effect of Fabrication Parameters on Three-Dimensional Nanostructures and Device Efficiency of Polymer Light-Emitting Diodes

By using 10 kV C(60)(+) and 200 V Ar(+) ion co-sputtering, a crater was created on the light-emitting layer of phosphorescent polymer light-emitting diodes, which consisted of a poly(9-vinyl carbazole) (PVK) host doped with a 24 wt % iridium(III)bis[(4,6-difluorophenyl)pyridinato-N,C(2)] (FIrpic) guest. A force modulation microscope (FMM) was used to analyze the nanostructure at the flat slope near the edge of the crater. The three-dimensional distribution of PVK and FIrpic was determined based on the difference in their mechanical properties from FMM. It was found that significant phase separation occurred when the luminance layer was spin coated at 30 degrees C, and the phase-separated nanostructure provides a route for electron transportation using the guest-enriched phase. This does not generate excitons on the host, which would produce photons less effectively. On the other hand, a more homogeneous distribution of molecules was observed when the layer was spin coated at 60 degrees C. As a result, a 30% enhancement in device performance was observed.

Three-Dimensional Nanoscale Imaging of Polymer Bulk-Heterojunction by Scanning Electrical Potential Microscopy and C60+ Cluster Ion Slicing

Solution-processable fullerene and copolymer bulk-heterojunctions are widely used as the active layer of solar cells. It is known that the controlled phase-separation in the film provides a pathway for carrier transportation and is crucial to efficiency. In this work, scanning electrical potential microscopy (SEPM) is used to examine the surface distribution of [6,6]phenyl-C61-butyric acid methyl ester and poly(3-hexylthiophene), which form the bulk-heterojunction. Because the two components have different energies in the highest occupied molecular orbital (HOMO), the differences in contact potential yield strong contrast in SEPM. A cluster ion beam (C(60)(+)) is used to remove the surface in order to determine the structure below, and SEPM is used to analyze the newly exposed surface. With the SEPM images acquired from different depth through the material stacked, a 3D volume image is obtained. It is demonstrated that using SEPM with cluster ion slicing is an effective tool for studying the 3D nanostructures of soft materials.

Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+

Dynamic secondary ion mass spectrometry (D-SIMS) analysis of poly(ethylene terephthalate) (PET) and poly(methyl methacrylate) (PMMA) was conducted using a quadrupole mass analyzer with various combinations of continuous C(60)(+) and Ar(+) ion sputtering. Individually, the Ar(+) beam failed to generate fragments above m/z 200, and the C(60)(+) beam generated molecular fragments of m/z ~1000. By combining the two beams, the auxiliary Ar(+) beam, which is proposed to suppress carbon deposition due to C(60)(+) bombardment and/or remove graphitized polymer, the sputtering range of the C(60)(+) beam is extended. Another advantage of this technique is that the high sputtering rate and associated high molecular ion intensity of the C(60)(+) beam generate adequate high-mass fragments that mask the damage from the Ar(+) beam. As a result, fragments at m/z ~900 can be clearly observed. As a depth-profiling tool, the single C(60)(+) beam cannot reach a steady state for either PET or PMMA at high ion fluence, and the intensity of the molecular fragments produced by the beam decreases with increasing C(60)(+) fluence. As a result, the single C(60)(+) beam is suitable for profiling surface layers with limited thickness. With C(60)(+)-Ar(+) co-sputtering, although the initial drop in intensity is more significant than with single C(60)(+) ionization because of the damage introduced by the auxiliary Ar(+), the intensity levels indicate that a more steady-state process can be achieved. In addition, the secondary ion intensity at high fluence is higher with co-sputtering. As a result, the sputtered depth is enhanced with co-sputtering and the technique is suitable for profiling thick layers. Furthermore, co-sputtering yields a smoother surface than single C(60)(+) sputtering.

Double wavelength infrared emission by plasmonic thermal emitter

Double wavelength infrared emission by plasmonic thermal emitter using stacked Au/SiO2/Au structure was proposed. Two different localized surface plasmon modes were excited with the same metal width which was attributed to the different effective refractive index of SiO2 layers in top and bottom Au / SiO2 / Au tri-layer structures.