T. C. Back

Hysteresis during field emission from chemical vapor deposition synthesized carbon nanotube fibers

Hysteresis in the field emission (FE) data of a chemical vapor synthesized carbon nanotube fiber cathode is analyzed in the regime where self-heating effects are negligible. In both the forward and reverse applied field sweeps, various FE modes of operation are identified: including Fowler-Nordheim (FN) tunneling and space-charge limited emission from the fiber tip and FN emission from the fiber sidewall. Hysteresis in the FE data is linked to the difference in the field enhancement factors in the different FE modes of operation in the forward and reverse sweeps and related to changes in the fiber morphology.

Evidence for adsorbate-enhanced field emission from carbon nanotube fibers

We used residual gas analysis (RGA) to identify the species desorbed during field emission (FE) from a carbon nanotube (CNT) fiber. The RGA data show a sharp threshold for H2 desorption at an external field strength that coincides with a breakpoint in the FE data. A comprehensive model for the gradual transition of FE from adsorbate-enhanced CNTs at low bias to FE from CNTs with reduced H2 adsorbate coverage at high bias is developed which accounts for the gradual desorption of the H2 adsorbates, alignment of the CNTs at the fiber tip, and importance of self-heating effects with applied bias.

Multiscale model of heat dissipation mechanisms during field emission from carbon nanotube fibers

A multiscale model of field emission (FE) from carbon nanotube fibers (CNFs) is developed, which takes into account Joule heating within the fiber and radiative cooling and the Nottingham effect at the tip of the individual carbon nanotubes (CNTs) in the array located at the fiber tip. The model predicts the fraction of CNTs being destroyed as a function of the applied external electric field and reproduces many experimental features observed in some recently investigated CNFs, such as order of magnitude of the emission current (mA range), low turn on electric field (fraction of V/μm), deviation from pure Fowler-Nordheim behavior at large applied electric field, hysteresis of the FE characteristics, and a spatial variation of the temperature along the CNF axis with a maximum close to its tip of a few hundred u2009°C.

Progress in the development of a multiscale model of the field emission properties of carbon nanotube fibers

Recently, we presented a multiscale model of field electron emission (FE) from carbon nanotube fibers (CNFs), taking into account Joule heating within the fiber, radiative cooling from its surface and Henderson/Nottingham-type cooling and heating effects at the tips of the individual carbon nanotubes (CNTs) located on the fiber apex [1]. The model was used to predict the CNT fraction destroyed as a function of the applied external electric field. The model reproduces many experimental features observed in recent investigations of CNFs, including the emission current order-of-magnitude (mA range), the low turn-on macroscopic field (fraction of V/μm), deviation from pure Fowler-Nordheim behavior at large applied electric field, irreversibility loops in the FE characteristics, and a spatial variation of the temperature along the CNF axis, with a maximum a few hundred °C close to its apex. In this paper, this model is used to investigate how electrostatic screening and details of the CNT array at the fiber apex might affect the overall emission characteristics.

A new fit to secondary emission yield in the low impact voltage regime: An improvement of Vaughan’s expression

Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.