T. Grzela
Poznań University of Technology
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Featured researches published by T. Grzela.
Journal of Applied Physics | 2014
T. Grzela; Wojciech Koczorowski; G. Capellini; Ryszard Czajka; Marian W. Radny; N. J. Curson; Steven R. Schofield; M. A. Schubert; T. Schroeder
Cobalt germanide (CoxGey) is a candidate system for low resistance contact modules in future Ge devices in Si-based micro and nanoelectronics. In this paper, we present a detailed structural, morphological, and compositional study on CoxGey formation on Ge(001) at room temperature metal deposition and subsequent annealing. Scanning tunneling microscopy and low energy electron diffraction clearly demonstrate that room temperature deposition of approximately four monolayers of Co on Ge(001) results in the Volmer Weber growth mode, while subsequent thermal annealing leads to the formation of a Co-germanide continuous wetting layer which evolves gradually towards the growth of elongated CoxGey nanostructures. Two types of CoxGey nanostructures, namely, flattop- and ridge-type, were observed and a systematic study on their evolution as a function of temperature is presented. Additional transmission electron microscopy and x-ray photoemission spectroscopy measurements allowed us to monitor the reaction between ...
Nanotechnology | 2015
T. Grzela; G. Capellini; Wojciech Koczorowski; M. A. Schubert; Ryszard Czajka; N. J. Curson; I. Heidmann; Th. Schmidt; J. Falta; T. Schroeder
Nickel germanide is deemed an excellent material system for low resistance contact formation for future Ge device modules integrated into mainstream, Si-based integrated circuit technologies. In this study, we present a multi-technique experimental study on the formation processes of nickel germanides on Ge(001). We demonstrate that room temperature deposition of ∼1 nm of Ni on Ge(001) is realized in the Volmer-Weber growth mode. Subsequent thermal annealing results first in the formation of a continuous NixGey wetting layer featuring well-defined terrace morphology. Upon increasing the annealing temperature to 300 °C, we observed the onset of a de-wetting process, characterized by the appearance of voids on the NixGey terraces. Annealing above 300 °C enhances this de-wetting process and the surface evolves gradually towards the formation of well-ordered, rectangular NixGey 3D nanostructures. Annealing up to 500 °C induces an Ostwald ripening phenomenon, with smaller nanoislands disappearing and larger ones increasing their size. Subsequent annealing to higher temperatures drives the Ni-germanide diffusion into the bulk and the consequent formation of highly ordered, {111} faceted Ni-Ge nanocrystals featuring an epitaxial relationship with the substrate Ni-Ge (101); (010) || Ge(001); (110).
Nanotechnology | 2016
M. Ewert; Th. Schmidt; Jan Ingo Flege; I. Heidmann; T. Grzela; W. M. Klesse; M. Foerster; L. Aballe; T. Schroeder; J. Falta
The reactive growth of cobalt germanide on Ge(001) was investigated by means of in situ x-ray absorption spectroscopy photoemission electron microscopy (XAS-PEEM), micro-illumination low-energy electron diffraction (μ-LEED), and ex situ atomic force microscopy (AFM). At a Co deposition temperature of 670 °C, a rich morphology with different island shapes and dimensions is observed, and a correlation between island morphology and stoichiometry is found. By combining XAS-PEEM and μ-LEED, we were able to identify a large part of the islands to consist of CoGe2, with many of them having an unusual epitaxial relationship: CoGe2 [Formula: see text] [Formula: see text] Ge [Formula: see text]. Side facets with (112) and (113) orientation have been found for such islands. However, two additional phases were observed, most likely Co5Ge7 and CoGe. Comparing growth on Ge(001) single crystals and on Ge(001)/Si(001) epilayer substrates, the occurrence of these intermediate phases seems to be promoted by defects or residual strain.
Physical Review B | 2016
Wojciech Koczorowski; A. Puchalska; T. Grzela; L. Jurczyszyn; Steven R. Schofield; Ryszard Czajka; N. J. Curson; Marian W. Radny
Applied Surface Science | 2017
Wojciech Koczorowski; T. Grzela; A. Puchalska; L. Jurczyszyn; Ryszard Czajka; Marian W. Radny
Physical Review B | 2015
Wojciech Koczorowski; A. Puchalska; T. Grzela; Marian W. Radny; L. Jurczyszyn; Steven R. Schofield; Ryszard Czajka; N. J. Curson
Applied Surface Science | 2018
Wojciech Koczorowski; T. Grzela; A. Puchalska; Marian W. Radny; L. Jurczyszyn; Steven R. Schofield; Ryszard Czajka; N. J. Curson
Archive | 2017
Ryszard Czajka; T. Grzela
arXiv: Materials Science | 2016
M. Ewert; Th. Schmidt; J. I. Flege; I. Heidmann; T. Grzela; W. M. Klesse; M. Foerster; L. Aballe; T. Schroeder; J. Falta
Bulletin of the American Physical Society | 2015
N. J. Curson; Wojciech Koczorowski; T. Grzela; Marian W. Radny; Steven R. Schofield; G. Capellini; Ryszard Czajka; T. Schroeder