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Featured researches published by T. Laiho.


Applied Surface Science | 2003

XPS study of irradiation damage and different metal–sulfur bonds in dodecanethiol monolayers on gold and platinum surfaces

T. Laiho; J.A. Leiro; Jukka Lukkari

The X-ray induced irradiation damage is studied in the CH3(CH2)11SH monolayers on gold and platinum surfaces to get information on the metal–sulfur bonds. This is important because the sulfur–substrate bond is one of the crucial factors in thiol SAMs. The X-ray photoelectron spectra (XPS) of the S 2p and C 1s emission were analyzed. During the modification of the surface the thiol/platinum system behaves differently than the thiol/gold system. In the latter case the S 2p spectrum changes as a function of time during the measurement and two chemically different sulfur species, associated with Au-thiolates and irradiation induced sulfur species, can be identified in the spectra. On platinum, there are two chemically different sulfur species in pristine monolayers and their ratio remains unchanged as a function of measurement time. This trend is obviously surface induced and is related to the nature of the metal–sulfur bonds in the self-assembled thiol layers.


Journal of Materials Chemistry C | 2014

Effective low temperature reduction of graphene oxide with vanadium(III)

Jussi Kauppila; Liisa Lund; T. Laiho; Mikko Salomäki; Jouko Kankare; Jukka Lukkari

Reduction of graphene oxide (GO) with vanadium(III) trichloride under various reaction conditions has been investigated. The results show that V(III) can be used as an efficient reducing agent for GO in aqueous solutions at low concentrations and in moderate temperatures under ambient conditions. The IR spectroscopy and X-ray photoelectron spectroscopy (XPS) show that the structure of the vanadium-reduced material is similar to reduced graphene oxide prepared using TiCl3 or hydrazine as a reducing agent. The electrical conductivity of the material is also similar in all cases. However, on the basis of the XPS results, vanadium-based reduction does not leave significant reductant impurities in the product and does not lead to graphene substitution reactions. The success of vanadium(III) is somewhat surprising because the formal redox potential of the V(IV)/V(III) pair is rather anodic, but spectrophotometric studies of the reaction unambiguously showed that the process is a redox reaction. This method introduces a new facile graphene oxide reduction technique, which can be applied under ambient aqueous conditions.


Journal of Physical Chemistry B | 2005

Water-soluble full-length single-wall carbon nanotube polyelectrolytes: preparation and characterization.

Hanna Paloniemi; Timo Ääritalo; T. Laiho; Hanna Liuke; Natalia Kocharova; Keijo Haapakka; Fabio Terzi; Renato Seeber; Jukka Lukkari


Macromolecules | 2004

Counteranion-Controlled Properties of Polyelectrolyte Multilayers

Mikko Salomäki; T. Laiho; Jouko Kankare


Journal of Electron Spectroscopy and Related Phenomena | 2005

Photoelectron spectroscopy study of irradiation damage and metal–sulfur bonds of thiol on silver and copper surfaces

T. Laiho; J.A. Leiro; Markku Heinonen; S. Mattila; Jukka Lukkari


Surface Science | 2006

Core level spectroscopy of MoS2

S. Mattila; J.A. Leiro; Markku Heinonen; T. Laiho


Surface and Interface Analysis | 2004

Surface analysis of Co–Cr–Mo alloy and Ti substrates silanized with trialkoxysilanes and silane mixtures

Jukka Pekka Matinlinna; K. Laajalehto; T. Laiho; Ilkka Kangasniemi; Lippo V.J. Lassila; Pekka K. Vallittu


Surface Science | 2005

Chemisorption of alkyl thiols and S-alkyl thiosulfates on Pt(111) and polycrystalline platinum surfaces

T. Laiho; Jukka Lukkari; M. Meretoja; K. Laajalehto; Jouko Kankare; J.A. Leiro


Applied Surface Science | 2006

Influence of initial oxygen on the formation of thiol layers

T. Laiho; J.A. Leiro


Langmuir | 2003

Phosphonic acid derivatized polythiophene: A building block for metal phosphonate and polyelectrolyte multilayers

Antti Viinikanoja; Jukka Lukkari; Timo Ääritalo; T. Laiho; Jouko Kankare

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A. Szczerbakow

Polish Academy of Sciences

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