T.S. Sathiaraj
University of Botswana
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by T.S. Sathiaraj.
Microelectronics Journal | 2008
T.S. Sathiaraj
Indium tin oxide (ITO) thin films were prepared by RF sputtering of ceramic ITO target in pure argon atmosphere at a high base pressure of 3x10^-^4mbar without substrate heating and oxygen admittance. The use of pure argon during deposition resulted in films with high transparency (80-85%) in the visible and IR wavelength region. The films were subsequently annealed in air in the temperature range 100-400^oC. The annealed films show decreased transmittance in the IR region and decreased resistivity. The films were characterized by electron microscopy, spectrophotometry and XRD. The predominant orientation of the films is (222) instead of (400). The transmission and reflection spectra in the wavelength range 300-2500nm are used to study the optical behaviour of the films. The optical transmittance and reflectance spectra of the films were simultaneously simulated with different dielectric function models. The best fit of the spectrophotometric data was obtained using the frequency-dependent damping constant in the Drude model coupled with the Bruggeman effective medium theory for the surface roughness. It has been found that the sputtering power and the chamber residual pressure play a key role in the resulting optical properties. This paper presents the refractive index profile, the structure determined from the XRD and the electrical properties of ITO films. It has been found from the electrical measurement that films sputtered at 200W power and subsequently annealed at 400^oC have a sheet resistance of 80@W/@? and resistivity of 1.9x10^-^3@Wcm.
International Nano Letters | 2013
Jasmeet Kaur; Praveen Kumar; T.S. Sathiaraj; R. Thangaraj
This paper presents the structural, optical and photoluminescence properties of wet chemically synthesized ZnO:Pd2+ colloidal nanocrystals characterised by X-ray diffraction, scanning electron microscopy/energy-dispersive X-ray spectroscopy (EDS) and Fourier transform infrared spectroscopic techniques. Increase in lattice parameters from diffraction data indicates the incorporation of Pd2+ in the ZnO crystal lattice. A small amount of dopant favours the formation of stoichiometric ZnO nanoparticles; otherwise, non-stoichiometric nanocrystal formation was observed from the EDS data. The optical gap was found to decrease with the doping concentration, except for the small dopant level of 0.05% of Pd2+ where an increase in the optical gap was observed. Intensities of characteristic luminescence bands for pure ZnO nanocrystals (357, 387 and 420 nm) were found to decrease with the increasing Pd2+ concentration, and two new bands centred at 528 and 581 nm for 0.5% Pd2+ concentration were observed. These results have been explained on the basis of change in the oxygen vacancy-related defects and/or formation of new trap states which in turn affect the luminescence properties of ZnO:Pd2+ nanocrystals, which are important in the realisation of visible light-emitting solid-state devices.
Philosophical Magazine Letters | 2010
Praveen Kumar; T.S. Sathiaraj; R. Thangaraj
The measurements and analysis of optical transmission and far-infrared (IR) reflectivity spectra of thermally evaporated Sb2Se3:Sn films are reported. The refractive index and film thickness have been determined from the upper and lower envelopes of the transmission spectra (Swanepoels standard envelope method), measured at normal incidence, in the spectral range from 800 to 2500 nm. Values of the refractive index fit well to Cauchys dispersion relation. The optical gap decreases with an increase in the Sn content, while a maximum in the tailing parameter and Urbachs energy occurs with only a small amount (∼1 at %) of this additive. Characteristic vibrational bands for SbSe3 structural units are revealed in the far-IR spectrum with no additional ones arising from the Sn additive. The Kramers–Kronig analysis has been used to calculate the dielectric constants and hence the longitudinal optic and transverse optic splitting for various compositions. The inclusion of Sn as a charged entity along with the Coulomb interactions which serve to polarize the glass medium is found to be responsible for these results.
Physica B-condensed Matter | 2013
Davinder Singh; Shiv Kumar; R. Thangaraj; T.S. Sathiaraj
Materials Chemistry and Physics | 2012
Praveen Kumar; S.N. Yannopoulos; T.S. Sathiaraj; R. Thangaraj
Physica Status Solidi (a) | 2011
Praveen Kumar; R. Thangaraj; T.S. Sathiaraj
Optics and Laser Technology | 2017
H. Nyakotyo; T.S. Sathiaraj; E. Muchuweni
Optics and Laser Technology | 2017
H. Nyakotyo; T.S. Sathiaraj; E. Muchuweni
Journal of Non-crystalline Solids | 2010
Praveen Kumar; R. Thangaraj; T.S. Sathiaraj
Materials Science in Semiconductor Processing | 2017
E. Muchuweni; T.S. Sathiaraj; H. Nyakotyo
Collaboration
Dive into the T.S. Sathiaraj's collaboration.
Botswana International University of Science and Technology
View shared research outputsBotswana International University of Science and Technology
View shared research outputs