Tae-chul Jung

IEEE 802.1 AVB and Its Application in Carrier-Grade Ethernet [Standards Topics]

Ethernet is increasingly being used in carrier networks to transport real-time traffic, including wireless backhaul network traffic, time-sensitive audio/video applications in access networks, and circuit emulation for legacy services. With the replacement of traditional circuit-switched networks with Ethernet-based packet networks, it must be ensured that the application timing and QoS requirements are met. The IEEE 802.1 Audio/Video Bridging Task Group is developing a comprehensive set of standards to enable high quality, low-latency streaming of time-sensitive applications. These standards specify a means of providing time synchronization (IEEE 802.IAS), a resource reservation protocol (IEEE 802.1Qat), and a set of forwarding and queuing rules that bound the variability of delay in an AVB network (IEEE 802.1Qav). These standards are described, including their potential application to carrier-grade Ethernet networks.

Divide-and-conquer in wafer scale array testing

Testing of wafer scale arrays is very time consuming if classical loopback testing is used. In this paper, a divide-and-conquer technique for testing wafer scale arrays is presented. The technique is general in the sense that it can be applied to any regular topologies. Although the proposed scheme also suffers from long testing time in the worst case, it is shown to be very efficient for most of the possible fault patterns. Insertion of test points is also considered to physically partition the arrays so that the desired performance can be achieved regardless of the array size.<<ETX>>

Fault diagnosis of interconnection circuits in wafer scale arrays

An efficient diagnosis algorithm for data paths (or interconnection circuits) in reconfigurable arrays is proposed. The data paths, including data registers, data links, and programmable switches, are tested by applying test patterns from the outside of an array. Fault-free paths identified partition the array into smaller subarrays so that testing can be done recursively. Fault masking due to programmable switch failures is examined. A sufficient condition to avoid fault masking is obtained. The performance of the diagnosis algorithm is evaluated by computer simulation.<<ETX>>